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LMK04828-EP

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温度范围为 -55°C 至 105°C 且符合 JESD204B 标准的超低噪声时钟抖动消除器

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LMK04828-EP

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产品详情

Number of input channels 3 Number of outputs 14 RMS jitter (fs) 88 Features JESD204B Output frequency (min) (MHz) 0.001 Output frequency (max) (MHz) 3200 Output type LVDS, LVPECL Input type LVCMOS, LVDS, LVPECL Supply voltage (min) (V) 3.15 Supply voltage (max) (V) 3.3 Operating temperature range (°C) -55 to 105
Number of input channels 3 Number of outputs 14 RMS jitter (fs) 88 Features JESD204B Output frequency (min) (MHz) 0.001 Output frequency (max) (MHz) 3200 Output type LVDS, LVPECL Input type LVCMOS, LVDS, LVPECL Supply voltage (min) (V) 3.15 Supply voltage (max) (V) 3.3 Operating temperature range (°C) -55 to 105
WQFN (NKD) 64 81 mm² 9 x 9
  • EP Features
    • Gold Bondwires
    • Temperature Range: –55 to +105 °C
    • Lead Finish SnPb
  • Maximum Distribution Frequency: 3.2 GHz
  • JESD204B Support
  • Ultra-Low RMS Jitter
    • 88-fs RMS Jitter (12 kHz to 20 MHz)
    • 91-fs RMS Jitter (100 Hz to 20 MHz)
    • –162.5 dBc/Hz Noise Floor at 245.76 MHz
  • Up to 14 Differential Device Clocks From PLL2
    • Up to 7 SYSREF Clocks
    • Maximum Clock Output Frequency 3.2 GHz
    • LVPECL, LVDS, HSDS, LCPECL Programmable Outputs From PLL2
  • Up to 1 Buffered VCXO/Crystal Output From PLL1
    • LVPECL, LVDS, 2xLVCMOS Programmable
  • Multi-Mode: Dual PLL, Single PLL, and Clock Distribution
  • Dual Loop PLLatinum™ PLL Architecture
  • PLL1
    • Up to 3 Redundant Input Clocks
      • Automatic and Manual Switchover Modes
      • Hitless Switching and LOS
    • Integrated Low-Noise Crystal Oscillator Circuit
    • Holdover Mode When Input Clocks are Lost
  • PLL2
    • Normalized [1 Hz] PLL Noise Floor of
      –227 dBc/Hz
    • Phase Detector Rate up to 155 MHz
    • OSCin Frequency-Doubler
    • Two Integrated Low-Noise VCOs
  • 50% Duty Cycle Output Divides, 1 to 32
    (Even and Odd)
  • Precision Digital Delay, Dynamically Adjustable
  • 25-ps Step Analog Delay
  • 3.15-V to 3.45-V Operation
  • Package: 64-Pin WQFN (9.0 mm × 9.0 mm × 0.8 mm)
  • EP Features
    • Gold Bondwires
    • Temperature Range: –55 to +105 °C
    • Lead Finish SnPb
  • Maximum Distribution Frequency: 3.2 GHz
  • JESD204B Support
  • Ultra-Low RMS Jitter
    • 88-fs RMS Jitter (12 kHz to 20 MHz)
    • 91-fs RMS Jitter (100 Hz to 20 MHz)
    • –162.5 dBc/Hz Noise Floor at 245.76 MHz
  • Up to 14 Differential Device Clocks From PLL2
    • Up to 7 SYSREF Clocks
    • Maximum Clock Output Frequency 3.2 GHz
    • LVPECL, LVDS, HSDS, LCPECL Programmable Outputs From PLL2
  • Up to 1 Buffered VCXO/Crystal Output From PLL1
    • LVPECL, LVDS, 2xLVCMOS Programmable
  • Multi-Mode: Dual PLL, Single PLL, and Clock Distribution
  • Dual Loop PLLatinum™ PLL Architecture
  • PLL1
    • Up to 3 Redundant Input Clocks
      • Automatic and Manual Switchover Modes
      • Hitless Switching and LOS
    • Integrated Low-Noise Crystal Oscillator Circuit
    • Holdover Mode When Input Clocks are Lost
  • PLL2
    • Normalized [1 Hz] PLL Noise Floor of
      –227 dBc/Hz
    • Phase Detector Rate up to 155 MHz
    • OSCin Frequency-Doubler
    • Two Integrated Low-Noise VCOs
  • 50% Duty Cycle Output Divides, 1 to 32
    (Even and Odd)
  • Precision Digital Delay, Dynamically Adjustable
  • 25-ps Step Analog Delay
  • 3.15-V to 3.45-V Operation
  • Package: 64-Pin WQFN (9.0 mm × 9.0 mm × 0.8 mm)

The LMK04828-EP device is the industry’s highest performance clock conditioner with JESD204B support.

The 14 clock outputs from PLL2 can be configured to drive seven JESD204B converters or other logic devices using device and SYSREF clocks. SYSREF can be provided using both DC and AC coupling. Not limited to JESD204B applications, each of the 14 outputs can be individually configured as high-performance outputs for traditional clocking systems.

The high performance combined with features like the ability to trade off between power or performance, dual VCOs, dynamic digital delay, holdover, and glitchless analog delay make the LMK04828-EP ideal for providing flexible high-performance clocking trees.

The LMK04828-EP device is the industry’s highest performance clock conditioner with JESD204B support.

The 14 clock outputs from PLL2 can be configured to drive seven JESD204B converters or other logic devices using device and SYSREF clocks. SYSREF can be provided using both DC and AC coupling. Not limited to JESD204B applications, each of the 14 outputs can be individually configured as high-performance outputs for traditional clocking systems.

The high performance combined with features like the ability to trade off between power or performance, dual VCOs, dynamic digital delay, holdover, and glitchless analog delay make the LMK04828-EP ideal for providing flexible high-performance clocking trees.
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* 数据表 LMK04828-EP Ultra-Low-Noise, JESD204B-Compliant Clock Jitter Cleaner 数据表 PDF | HTML 2017年 4月 3日
应用手册 Multi-Clock Synchronization 2019年 12月 30日

设计与开发

如需其他信息或资源，请点击以下任一标题进入详情页面查看（如有）。

支持软件

TICSPRO-SW — TICS Pro GUI and Live Programming Tool for Clocking Devices

Texas Instruments clocks and synthesizers (TICS) pro software is used to program the evaluation modules (EVMs) for product numbers with these prefixes: CDC, LMK and LMX. These products include phase-locked loops and voltage-controlled oscillators (PLL+VCO), synthesizers and clocking devices.

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仿真模型

LMK04828 IBIS Model (Rev. F)

SNAM148F.ZIP (175 KB) - IBIS Model
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设计工具

CLOCK-TREE-ARCHITECT — 时钟树架构编程软件

时钟树架构是一款时钟树综合工具，可根据您的系统要求生成时钟树解决方案，从而帮助您简化设计流程。该工具从庞大的时钟产品数据库中提取数据，然后生成系统级多芯片时钟解决方案。
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PLLATINUMSIM-SW — PLL loop filter, phase noise, lock time, and spur simulation tool

PLLATINUMSIM-SW is a simulation tool that allows users to create detailed designs and simulations of our PLLatinum™ integrated circuits, which include the LMX series of phase-locked loops (PLLs) and synthesizers.

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PSPICE-FOR-TI — PSpice® for TI 设计和仿真工具

PSpice® for TI 可提供帮助评估模拟电路功能的设计和仿真环境。此功能齐全的设计和仿真套件使用 Cadence® 的模拟分析引擎。PSpice for TI 可免费使用，包括业内超大的模型库之一，涵盖我们的模拟和电源产品系列以及精选的模拟行为模型。

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WQFN (NKD) 64 Ultra Librarian
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包含信息：
  • RoHS
  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
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  • 封装厂地点

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