SPRUJB6B November 2024 – May 2025 AM2612
| Signal Name | I/O Type | Description |
|---|---|---|
| TCK | I |
Test Clock. Controls the timing of the test interface independently from any system clocks. TCK is pulsed by the equipment controlling the test and not by the tested device. |
| TMS | I |
Test Mode Select. Controls the transitions of the test interface state machine |
| TDI | I |
Test Data Input. Supplies the data to the JTAG registers |
| TDO | O/Z |
Test Data Output. Used to serially output the data from the JTAG registers to the equipment controlling the test. |