SPRUJ79 November 2024 F29H850TU , F29H859TU-Q1
Table 13-22 lists the memory-mapped registers for the RTDMA_SELFTEST_REGS registers. All register offset addresses not listed in Table 13-22 should be considered as reserved locations and the register contents should not be modified.
| Offset | Acronym | Register Name | Protection |
|---|---|---|---|
| 0h | SELFTEST_DIAG_DATA0 | Diagnostics data register 0 | |
| 4h | SELFTEST_DIAG_DATA1 | Diagnostics data register 1 | |
| 8h | SELFTEST_DIAG_DATA2 | Diagnostics data register 2 | |
| 20h | SELFTEST_DIAG_ECC | Diagnostics ECC | |
| 28h | SELFTEST_DIAG_CONTROL | Diagnostic test enable | |
| 2Ch | SELFTEST_DIAG_STATUS | Diagnostic status register | |
| 30h | SELFTEST_DIAG_STATUS_CLR | Diagnostic status clear register |
Complex bit access types are encoded to fit into small table cells. Table 13-23 shows the codes that are used for access types in this section.
| Access Type | Code | Description |
|---|---|---|
| Read Type | ||
| R | R | Read |
| R-0 | R -0 | Read Returns 0s |
| Write Type | ||
| W | W | Write |
| W1S | W 1S | Write 1 to set |
| Reset or Default Value | ||
| -n | Value after reset or the default value | |
| Register Array Variables | ||
| i,j,k,l,m,n | When these variables are used in a register name, an offset, or an address, they refer to the value of a register array where the register is part of a group of repeating registers. The register groups form a hierarchical structure and the array is represented with a formula. | |
| y | When this variable is used in a register name, an offset, or an address it refers to the value of a register array. | |
SELFTEST_DIAG_DATA0 is shown in Figure 13-22 and described in Table 13-24.
Return to the Summary Table.
Diagnostics data register 0
| 31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 | 23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 | 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 | 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
| SELFTEST_DIAG_DATA0 | |||||||||||||||||||||||||||||||
| R/W-0h | |||||||||||||||||||||||||||||||
| Bit | Field | Type | Reset | Description |
|---|---|---|---|---|
| 31-0 | SELFTEST_DIAG_DATA0 | R/W | 0h | Self test Diagnostics data 0 This register is used to specify the [31:0] bits of the data to perform Self test ECC checker diagnostics. Reset type: SYSRSn |
SELFTEST_DIAG_DATA1 is shown in Figure 13-23 and described in Table 13-25.
Return to the Summary Table.
Diagnostics data register 1
| 31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 | 23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 | 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 | 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
| SELFTEST_DIAG_DATA1 | |||||||||||||||||||||||||||||||
| R/W-0h | |||||||||||||||||||||||||||||||
| Bit | Field | Type | Reset | Description |
|---|---|---|---|---|
| 31-0 | SELFTEST_DIAG_DATA1 | R/W | 0h | Self test Diagnostics data 1 This register is used to specify the [63:32] bits of the data to perform Self test ECC checker diagnostics. Reset type: SYSRSn |
SELFTEST_DIAG_DATA2 is shown in Figure 13-24 and described in Table 13-26.
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Diagnostics data register 1
| 31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 | 23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 |
| RESERVED | SELFTEST_DIAG_DATA2 | ||||||||||||||
| R-0h | R/W-0h | ||||||||||||||
| 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 | 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
| SELFTEST_DIAG_DATA2 | |||||||||||||||
| R/W-0h | |||||||||||||||
| Bit | Field | Type | Reset | Description |
|---|---|---|---|---|
| 31-17 | RESERVED | R | 0h | Reserved |
| 16-0 | SELFTEST_DIAG_DATA2 | R/W | 0h | Self test Diagnostics data 2 This register is used to specify the [81:64] bits of the data to perform Self test ECC checker diagnostics. Reset type: SYSRSn |
SELFTEST_DIAG_ECC is shown in Figure 13-25 and described in Table 13-27.
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Diagnostics ECC
| 31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 | 23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 |
| RESERVED | |||||||||||||||
| R-0h | |||||||||||||||
| 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 | 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
| RESERVED | SELFTEST_DIAG_ECC | ||||||||||||||
| R-0h | R/W-0h | ||||||||||||||
| Bit | Field | Type | Reset | Description |
|---|---|---|---|---|
| 31-8 | RESERVED | R | 0h | Reserved |
| 7-0 | SELFTEST_DIAG_ECC | R/W | 0h | Self test Diagnostics ECC This register is used to specify the ECC to perform Self test ECC checker diagnostics Reset type: SYSRSn |
SELFTEST_DIAG_CONTROL is shown in Figure 13-26 and described in Table 13-28.
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Enable diagnostic test
| 31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 |
| DIAG_DATA_WIDTH | |||||||
| R/W-51h | |||||||
| 23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 |
| RESERVED | DIAG_ECC_WIDTH | ||||||
| R-0h | R/W-8h | ||||||
| 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
| RESERVED | DIAG_CHECKER_SEL | ||||||
| R-0h | R/W-0h | ||||||
| 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
| RESERVED | DIAG_SAFETY_SEL | RESERVED | DIAG_TEST_EN | ||||
| R-0h | R/W-0h | R-0h | R/W-0h | ||||
| Bit | Field | Type | Reset | Description |
|---|---|---|---|---|
| 31-24 | DIAG_DATA_WIDTH | R/W | 51h | ECC data width - Maximum configurable width is 81(0x51) Reset type: SYSRSn |
| 23-20 | RESERVED | R | 0h | Reserved |
| 19-16 | DIAG_ECC_WIDTH | R/W | 8h | ECC bit width - Maximum configurable width is 8 (0x8) Reset type: SYSRSn |
| 15-10 | RESERVED | R | 0h | Reserved |
| 9-8 | DIAG_CHECKER_SEL | R/W | 0h | This field is used to select the ECC checker. 00 : 16-bit ECC check 01 : 32-bit ECC check 10 : 64-bit ECC check Reset type: SYSRSn |
| 7 | RESERVED | R | 0h | Reserved |
| 6 | DIAG_SAFETY_SEL | R/W | 0h | Diagnostic safety selection 0 - ECC 1 - Parity Reset type: SYSRSn |
| 5-4 | RESERVED | R | 0h | Reserved |
| 3-0 | DIAG_TEST_EN | R/W | 0h | Enable self test mechanism 0011 : Enable self test This field will be '0000' once test done. User needs to write into this register again for next test. Note: Self test should not to be started in the middle of a transfer. Reset type: SYSRSn |
SELFTEST_DIAG_STATUS is shown in Figure 13-27 and described in Table 13-29.
Return to the Summary Table.
Diagnostic status
| 31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 |
| RESERVED | |||||||
| R-0h | |||||||
| 23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 |
| RESERVED | |||||||
| R-0h | |||||||
| 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
| DIAG_FAIL_BIT_INDEX | |||||||
| R-0h | |||||||
| 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
| RESERVED | DIAG_FAIL_CHECK_TYPE | DIAG_FAIL_UC_ERROR | DIAG_FAIL_C_ERROR | DIAG_TEST_FAIL | DIAG_TEST_DONE | RESERVED | |
| R-0h | R-0h | R-0h | R-0h | R-0h | R-0h | R-0h | |
| Bit | Field | Type | Reset | Description |
|---|---|---|---|---|
| 31-16 | RESERVED | R | 0h | Reserved |
| 15-8 | DIAG_FAIL_BIT_INDEX | R | 0h | This field is used to specify the position of the flipped bit when test failed. For 2 bit flips, this field points the bit position of the first bit. The second bit will be always adjacent to the first bit. This field will clear when next test configured. Reset type: SYSRSn |
| 7 | RESERVED | R | 0h | Reserved |
| 6-5 | DIAG_FAIL_CHECK_TYPE | R | 0h | 00 : Positive check 01 : Flips one bit 10 : Flips two bit 11 : Reserved Reset type: SYSRSn |
| 4 | DIAG_FAIL_UC_ERROR | R | 0h | This field is used to specify the diagnostic uncorrectable error when Test failed. Reset type: SYSRSn |
| 3 | DIAG_FAIL_C_ERROR | R | 0h | This field is used to specify the diagnostic correctable error when Test failed. Reset type: SYSRSn |
| 2 | DIAG_TEST_FAIL | R | 0h | 1 : Test failed (Unexpected error events(C_ERROR/UC_ERROR) occurred during self test) 0 : Test passed Reset type: SYSRSn |
| 1 | DIAG_TEST_DONE | R | 0h | Completed self test. Reset type: SYSRSn |
| 0 | RESERVED | R | 0h | Reserved |
SELFTEST_DIAG_STATUS_CLR is shown in Figure 13-28 and described in Table 13-30.
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Diagnostic status clear
| 31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 |
| RESERVED | |||||||
| R-0h | |||||||
| 23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 |
| RESERVED | |||||||
| R-0h | |||||||
| 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
| RESERVED | |||||||
| R-0h | |||||||
| 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
| RESERVED | DIAG_TEST_FAIL | DIAG_TEST_DONE | RESERVED | ||||
| R-0h | R-0/W1S-0h | R-0/W1S-0h | R-0h | ||||
| Bit | Field | Type | Reset | Description |
|---|---|---|---|---|
| 31-3 | RESERVED | R | 0h | Reserved |
| 2 | DIAG_TEST_FAIL | R-0/W1S | 0h | Clear Test failed status flags 0: Writing a 0 has no effect. 1: Writing a 1 will clear the fields SELFTEST_DIAG_STATUS[DIAG_TEST_FAIL], SELFTEST_DIAG_STATUS[DIAG_FAIL_C_ERROR], SELFTEST_DIAG_STATUS[DIAG_FAIL_UC_ERROR], SELFTEST_DIAG_STATUS[DIAG_FAIL_CHECK_TYPE]. Reset type: SYSRSn |
| 1 | DIAG_TEST_DONE | R-0/W1S | 0h | Clear self test done status flag 0: Writing a 0 has no effect. 1: Writing a 1 will clear the SELFTEST_DIAG_STATUS[DIAG_TEST_DONE] bit. Reset type: SYSRSn |
| 0 | RESERVED | R | 0h | Reserved |