SPRUJ17I March 2022 – August 2025 AM2631 , AM2631-Q1 , AM2632 , AM2632-Q1 , AM2634 , AM2634-Q1
The enhanced Self-Test Controller (STC) is used to test logic cores based on the On-Product Multiple Input Signature Register (OPMISR) scan compression architecture.
Software-based self-test programs for the cores are available, but offer less test coverage. Due to the complexity of the soft cores, the coverage required can be difficult to achieve and will result in a larger program size.
For these complex cores, on-chip logic BIST support for the self-test is preferred.
The main features of the STC include:
A self test segment corresponds to a portion of discreet safety-critical logic which can be tested in isolation from the rest of the system by the self test controller and OPMISR logic.