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TLC1543-EP

現行

具有序列控制 11 路類比輸入的強化型產品 10 位類比轉數位轉換器

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產品規格表

TLC1543-EP

現行
產品規格表 立即訂購

產品詳細資料

Resolution (Bits) 10 Sample rate (max) (ksps) 38 Number of input channels 11 Interface type SPI Architecture SAR Input type Single-ended Multichannel configuration Multiplexed Rating HiRel Enhanced Product Reference mode External Input voltage range (max) (V) 5.5 Input voltage range (min) (V) 0 Operating temperature range (°C) -40 to 125 Power consumption (typ) (mW) 4 Analog supply voltage (min) (V) 4.5 Analog supply voltage (max) (V) 5.5 Digital supply (min) (V) 4.5 Digital supply (max) (V) 5.5
Resolution (Bits) 10 Sample rate (max) (ksps) 38 Number of input channels 11 Interface type SPI Architecture SAR Input type Single-ended Multichannel configuration Multiplexed Rating HiRel Enhanced Product Reference mode External Input voltage range (max) (V) 5.5 Input voltage range (min) (V) 0 Operating temperature range (°C) -40 to 125 Power consumption (typ) (mW) 4 Analog supply voltage (min) (V) 4.5 Analog supply voltage (max) (V) 5.5 Digital supply (min) (V) 4.5 Digital supply (max) (V) 5.5
SOIC (DW) 20 131.84 mm² 12.8 x 10.3
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • 10-Bit Resolution A/D Converter
  • 11 Analog Input Channels
  • Three Built-In Self-Test Modes
  • Inherent Sample-and-Hold Function
  • Total Unadjusted Error . . . ±1 LSB Max
  • On-Chip System Clock
  • End-of-Conversion (EOC) Output
  • Terminal Compatible With TLC542
  • CMOS Technology

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • 10-Bit Resolution A/D Converter
  • 11 Analog Input Channels
  • Three Built-In Self-Test Modes
  • Inherent Sample-and-Hold Function
  • Total Unadjusted Error . . . ±1 LSB Max
  • On-Chip System Clock
  • End-of-Conversion (EOC) Output
  • Terminal Compatible With TLC542
  • CMOS Technology

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The TLC1542-EP and TLC1543-EP are CMOS 10-bit switched-capacitor successive-approximation analog-to-digital converters. These devices have three inputs, a 3-state output chip select (CS)\, input/output clock (I/O CLOCK), address input (ADDRESS), and data output (DATA OUT)] that provide a direct 4-wire interface to the serial port of a host processor. The TLC1542-EP and TLC1543-EP allow high-speed data transfers from the host.

In addition to a high-speed A/D converter and versatile control capability, the TLC1542-EP and TLC1543-EP have an on-chip 14-channel multiplexer that can select any one of 11 analog inputs or any one of three internal self-test voltages. The sample-and-hold function is automatic. At the end of the A/D conversion, the end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated in the TLC1542-EP and TLC1543-EP feature differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating free-air temperature range.

The TLC1542-EP and TLC1543-EP are CMOS 10-bit switched-capacitor successive-approximation analog-to-digital converters. These devices have three inputs, a 3-state output chip select (CS)\, input/output clock (I/O CLOCK), address input (ADDRESS), and data output (DATA OUT)] that provide a direct 4-wire interface to the serial port of a host processor. The TLC1542-EP and TLC1543-EP allow high-speed data transfers from the host.

In addition to a high-speed A/D converter and versatile control capability, the TLC1542-EP and TLC1543-EP have an on-chip 14-channel multiplexer that can select any one of 11 analog inputs or any one of three internal self-test voltages. The sample-and-hold function is automatic. At the end of the A/D conversion, the end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated in the TLC1542-EP and TLC1543-EP feature differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating free-air temperature range.
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技術文件

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重要文件 類型 標題 格式選項 日期
* Data sheet 10-Bit Analog-to-Digital Converters w/Serial Control & 11 Analog Inputs datasheet (Rev. A) 2006年 2月 21日
* VID TLC1543-EP VID V6204647 2016年 6月 21日
E-book Best of Baker's Best: Precision Data Converters -- SAR ADCs 2015年 5月 21日
Application note Determining Minimum Acquisition Times for SAR ADCs, part 2 2011年 3月 17日

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計算工具

ANALOG-ENGINEER-CALC — 類比工程師計算機

類比工程師的計算機旨在加速類比電路設計工程師定期使用的許多重複計算。此基於 PC 的工具提供圖形介面，列出各種常見計算，從使用回饋電阻器設定運算放大器增益到選擇適當的電路設計元件以穩定類比數位轉換器 (ADC) 驅動緩衝電路。

除了作為獨立工具使用外，此計算機還與類比工程師口袋參考中描述的概念相得益彰。

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設計工具

ADC-DAC-TO-VREF-SELECT-DESIGN-TOOL — The ADC-TO-VREF-SELECT tool enables the pairing of TI ADCs, DACs, and series voltage references.

The ADC-TO-VREF-SELECT tool enables the pairing of TI analog-to-digital converters (ADCs) and series voltage references. Users can select an ADC device and the desired reference voltage, and the tool will list up to two voltage reference recommendations.
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模擬工具

PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具

PSpice® for TI 是有助於評估類比電路功能的設計和模擬環境。這款全功能設計和模擬套件使用 Cadence® 的類比分析引擎。PSpice for TI 包括業界最大的模型庫之一，涵蓋我們的類比和電源產品組合，以及特定類比行為模型，且使用無需支付費用。

PSpice for TI 設計和模擬環境可讓您使用其內建函式庫來模擬複雜的混合訊號設計。在進行佈局和製造之前，建立完整的終端設備設計和解決方案原型，進而縮短上市時間並降低開發成本。 

在 PSpice for TI 設計與模擬工具中，您可以搜尋 TI (...)
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模擬工具

TINA-TI — 基於 SPICE 的類比模擬程式

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
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SOIC (DW) 20 Ultra Librarian
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