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類比轉數位轉換器 (ADC)
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THS1206-EP

現行

增強型產品 12 位元、6 Msps Adc 四通道 (配置)、Dsp/Up If 整合16X Fifo

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產品規格表

THS1206-EP

現行
產品規格表 立即訂購

產品詳細資料

Resolution (Bits) 12 Sample rate (max) (ksps) 6000 Number of input channels 4 Interface type Parallel Architecture Pipeline Input type Differential, Single-ended Multichannel configuration Simultaneous Sampling Rating HiRel Enhanced Product Reference mode External, Internal Input voltage range (max) (V) 4 Input voltage range (min) (V) 1.4 Operating temperature range (°C) -55 to 125 Power consumption (typ) (mW) 186 Analog supply voltage (min) (V) 4.75 Analog supply voltage (max) (V) 5.25 SNR (dB) 69 Digital supply (min) (V) 3 Digital supply (max) (V) 5.25
Resolution (Bits) 12 Sample rate (max) (ksps) 6000 Number of input channels 4 Interface type Parallel Architecture Pipeline Input type Differential, Single-ended Multichannel configuration Simultaneous Sampling Rating HiRel Enhanced Product Reference mode External, Internal Input voltage range (max) (V) 4 Input voltage range (min) (V) 1.4 Operating temperature range (°C) -55 to 125 Power consumption (typ) (mW) 186 Analog supply voltage (min) (V) 4.75 Analog supply voltage (max) (V) 5.25 SNR (dB) 69 Digital supply (min) (V) 3 Digital supply (max) (V) 5.25
TSSOP (DA) 32 89.1 mm² 11 x 8.1
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • High-Speed 6 MSPS ADC
  • 4 Single-Ended or 2 Differential Inputs
  • Simultaneous Sampling of 4 Single-Ended Signals or 2 Differential Signals or Combination of Both
  • Differential Nonlinearity Error: ±1 LSB
  • Integral Nonlinearity Error: ±1.8 LSB
  • Signal-to-Noise and Distortion Ratio: 68 dB at fI = 2 MHz
  • Auto-Scan Mode for 2, 3, or 4 Inputs
  • 3-V or 5-V Digital Interface Compatible
  • Low Power: 216 mW Max
  • 5-V Analog Single Supply Operation
  • Internal Voltage References . . . 50 PPM/°C and ±5% Accuracy
  • Glueless DSP Interface
  • Parallel µC/DSP Interface
  • Integrated FIFO
  • Available in TSSOP Package
  • applications
    • Radar Applications
    • Communications
    • Control Applications
    • High-Speed DSP Front-End
    • Selected Military Applications

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • High-Speed 6 MSPS ADC
  • 4 Single-Ended or 2 Differential Inputs
  • Simultaneous Sampling of 4 Single-Ended Signals or 2 Differential Signals or Combination of Both
  • Differential Nonlinearity Error: ±1 LSB
  • Integral Nonlinearity Error: ±1.8 LSB
  • Signal-to-Noise and Distortion Ratio: 68 dB at fI = 2 MHz
  • Auto-Scan Mode for 2, 3, or 4 Inputs
  • 3-V or 5-V Digital Interface Compatible
  • Low Power: 216 mW Max
  • 5-V Analog Single Supply Operation
  • Internal Voltage References . . . 50 PPM/°C and ±5% Accuracy
  • Glueless DSP Interface
  • Parallel µC/DSP Interface
  • Integrated FIFO
  • Available in TSSOP Package
  • applications
    • Radar Applications
    • Communications
    • Control Applications
    • High-Speed DSP Front-End
    • Selected Military Applications

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The THS1206 is a CMOS, low-power, 12-bit, 6 MSPS analog-to-digital converter (ADC). The speed, resolution, bandwidth, and single-supply operation are suited for applications in radar, imaging, high-speed acquisition, and communications. A multistage pipelined architecture with output error correction logic provides for no missing codes over the full operating temperature range. Internal control registers are used to program the ADC into the desired mode. The THS1206 consists of four analog inputs, which are sampled simultaneously. These inputs can be selected individually and configured to single-ended or differential inputs. An integrated 16 word deep FIFO allows the storage of data in order to take the load off of the processor connected to the ADC. Internal reference voltages for the ADC (1.5 V and 3.5 V) are provided.

An external reference can also be chosen to suit the dc accuracy and temperature drift requirements of the application. Two different conversion modes can be selected. In single conversion mode, a single and simultaneous conversion of up to four inputs can be initiated by using the single conversion start signal (CONVST)\. The conversion clock in single conversion mode is generated internally using a clock oscillator circuit. In continuous conversion mode, an external clock signal is applied to the CONV_CLK input of the THS1206. The internal clock oscillator is switched off in continuous conversion mode.

The THS1206 is a CMOS, low-power, 12-bit, 6 MSPS analog-to-digital converter (ADC). The speed, resolution, bandwidth, and single-supply operation are suited for applications in radar, imaging, high-speed acquisition, and communications. A multistage pipelined architecture with output error correction logic provides for no missing codes over the full operating temperature range. Internal control registers are used to program the ADC into the desired mode. The THS1206 consists of four analog inputs, which are sampled simultaneously. These inputs can be selected individually and configured to single-ended or differential inputs. An integrated 16 word deep FIFO allows the storage of data in order to take the load off of the processor connected to the ADC. Internal reference voltages for the ADC (1.5 V and 3.5 V) are provided.

An external reference can also be chosen to suit the dc accuracy and temperature drift requirements of the application. Two different conversion modes can be selected. In single conversion mode, a single and simultaneous conversion of up to four inputs can be initiated by using the single conversion start signal (CONVST)\. The conversion clock in single conversion mode is generated internally using a clock oscillator circuit. In continuous conversion mode, an external clock signal is applied to the CONV_CLK input of the THS1206. The internal clock oscillator is switched off in continuous conversion mode.
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重要文件 類型 標題 格式選項 日期
* Data sheet 12-Bit 6 MSPS, Simultaneous Sampling Analog-to-Digital Converters datasheet (Rev. A) 2003年 2月 19日
* VID THS1206-EP VID V6203609 2016年 6月 21日
* Radiation & reliability report THS1206MDAREP Reliability Report 2013年 1月 7日
Application note Noise Analysis for High Speed Op Amps (Rev. A) 2005年 1月 17日

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