SWCU194 March 2023 CC1314R10 , CC1354P10 , CC1354R10 , CC2674P10 , CC2674R10
The CC13x4x10 and CC26x4x10 devices use standard boundary scan as defined under the IEEE 1149.1 JTAG standard. Each DIO has a dedicated boundary scan cell that contains six registers (two each for output pins, bidirectional control pins, and input pins), as shown in Figure 6-11.
Of the six registers, three are shift registers and the other three are update registers. The shift registers are in a scan chain and connect across all the DIOs. There are few muxes inside each Boundary Scan Register cell that select between the test data and the functional data. The boundary scan implementation is intended to cover both DC parametric tests as well as IODFT testing. The 48 DIOs available in the CC13x4x10 and CC26x4x10 devices are categorized under different groups that are based on test pin muxing and tester-contacted and non-contacted I/Os. For further information regarding boundary scan I/O across different packages, see Table 6-22.
Pin Name | Tap Interface | Group |
---|---|---|
TCK | TAP_SCAN_CLOCK | |
TMS | TAP_SCAN_MODE | |
DIO0 - DIO15 | grp1 | |
DIO16 | TAP_SCAN_OUT | grp3 |
DIO17 | TAP_SCAN_IN | grp3 |
DIO18- DIO22 | grp1 | |
DIO23 - DIO24 | grp2 | |
DIO25 - DIO47 | grp1 |