测试和测量

The growing demand for ICs is driving an increase in both test channel density as well as an increase in voltages and currents, VI instruments need to support. Our power amplifiers, switches, and power modules allow for reduced solution sizes, enabling an increase in test channel density.

Minimizing noise is a common challenge for engineers designing a power supply for noise-sensitive systems for test and measurement applications, such as clocks, data converters or amplifiers. Although the term “noise” can mean different things to different people, we define noise as low-frequency thermal noise generated by resistors and transistors in the circuit.

You can identify noise through a spectral noise-density curve in microvolts per square-root hertz, and as integrated output noise in root-mean-square microvolts, typically over a specific range from 100 Hz to 100 kHz. We offers products and reference designs that help mitigate potential noise coupling that can affect the performance of devices in the signal chain.