ZHCSL05C October   2019  – October 2023 TPS65313-Q1

PRODUCTION DATA  

  1.   1
  2. 特性
  3. 应用
  4. 说明
  5. 器件功能方框图
  6. Revision History
  7. 说明(续)
  8. Device Option Table
  9. Pin Configuration and Functions
  10. Specifications
    1. 9.1  Absolute Maximum Ratings
    2. 9.2  ESD Ratings
    3. 9.3  Recommended Operating Conditions
    4. 9.4  Thermal Information
    5. 9.5  Power-On-Reset, Current Consumption, and State Timeout Characteristics
    6. 9.6  PLL/Oscillator and SYNC_IN Pin Characteristics
    7. 9.7  Wide-VIN Synchronous Buck Regulator (Wide-VIN BUCK) Characteristics
    8. 9.8  Low-Voltage Synchronous Buck Regulator (LV BUCK) Characteristics
    9. 9.9  Synchronous Boost Converter (BOOST) Characteristics
    10. 9.10 Internal Voltage Regulator (VREG) Characteristics
    11. 9.11 Voltage Monitors for Regulators Characteristics
    12. 9.12 External General Purpose Voltage Monitor Characteristics
    13. 9.13 VIN and VIN_SAFE Under-Voltage and Over-Voltage Warning Characteristics
    14. 9.14 WAKE Input Characteristics
    15. 9.15 NRES (nRESET) Output Characteristics
    16. 9.16 ENDRV/nIRQ Output Characteristics
    17. 9.17 Analog DIAG_OUT
    18. 9.18 Digital INPUT/OUTPUT IOs (SPI Interface IOs, DIAG_OUT/SYNC_OUT, MCU_ERROR)
    19. 9.19 BUCK1, BUCK2, BOOST Thermal Shutdown / Over Temperature Protection Characteristics
    20. 9.20 PGNDx Loss Detection Characteristics
    21. 9.21 SPI Timing Requirements
    22. 9.22 SPI Characteristics
    23. 9.23 Typical Characteristics
  11. 10Parameter Measurement Information
  12. 11Detailed Description
    1. 11.1  Overview
    2. 11.2  Functional Block Diagram
    3. 11.3  Wide-VIN Buck Regulator (BUCK1)
      1. 11.3.1 Fixed-Frequency Voltage-Mode Step-Down Regulator
      2. 11.3.2 Operation
      3. 11.3.3 Voltage Monitoring (Monitoring and Protection)
      4. 11.3.4 Overcurrent Protection (Monitoring and Protection)
      5. 11.3.5 Thermal Warning and Shutdown Protection (Monitoring and Protection)
      6. 11.3.6 Overvoltage Protection (OVP) (Monitoring and Protection)
      7. 11.3.7 Extreme Overvoltage Protection (EOVP) (Monitoring and Protection)
    4. 11.4  Low-Voltage Buck Regulator (BUCK2)
      1. 11.4.1 Fixed-Frequency Peak-Current Mode Step-Down Regulator
      2. 11.4.2 Operation
      3. 11.4.3 Output Voltage Monitoring (Monitoring and Protection)
      4. 11.4.4 Overcurrent Protection (Monitoring and Protection)
      5. 11.4.5 Thermal Sensor Warning and Thermal Shutdown Protection (Monitoring and Protection)
      6. 11.4.6 Overvoltage Protection (OVP) (Monitoring and Protection)
    5. 11.5  Low-Voltage Boost Converter (BOOST)
      1. 11.5.1 Output Voltage Monitoring (Monitoring and Protection)
      2. 11.5.2 Overcurrent Protection (Monitoring and Protection)
      3. 11.5.3 Thermal Sensor Warning and Shutdown Protection (Monitoring and Protection)
      4. 11.5.4 Overvoltage Protection (OVP) (Monitoring and Protection)
    6. 11.6  VREG Regulator
    7. 11.7  BUCK1, BUCK2, and BOOST Switching Clocks and Synchronization (SYNC_IN) Clock
      1. 11.7.1 Internal fSW Clock Configuration (fSW Derived from an Internal Oscillator)
      2. 11.7.2 BUCK1 Switching Clock-Monitor Error (Internal fSW Clock Configuration)
      3. 11.7.3 BUCK2 Switching Clock-Monitor Error (Internal fSW Clock Configuration)
      4. 11.7.4 BOOST Switching Clock-Monitor Error (Internal fSW Clock Configuration)
      5. 11.7.5 External fSW Clock Configuration (fSW Derived from SYNC_IN and PLL Clocks)
        1. 11.7.5.1 SYNC_IN, PLL, and VCO Clock Monitors
        2. 11.7.5.2 BUCK1 Switching Clock-Monitor Error (External fSW Clock Configuration)
        3. 11.7.5.3 BUCK2 Switching Clock-Monitor Error (External fSW Clock Configuration)
        4. 11.7.5.4 BOOST Switching Clock-Monitor Error (External fSW Clock Configuration)
    8. 11.8  BUCK1, BUCK2, and BOOST Switching-Clock Spread-Spectrum Modulation
    9. 11.9  Monitoring, Protection and Diagnostics Overview
      1. 11.9.1  Safety Functions and Diagnostic Overview
      2. 11.9.2  Supply Voltage Monitor (VMON)
      3. 11.9.3  Clock Monitors
      4. 11.9.4  Analog Built-In Self-Test
        1. 11.9.4.1 ABIST During Power-Up or Start-Up Event
        2. 11.9.4.2 ABIST in the RESET state
        3. 11.9.4.3 ABIST in the DIAGNOSTIC, ACTIVE, and SAFE State
        4. 11.9.4.4 ABIST Scheduler in the ACTIVE State
      5. 11.9.5  Logic Built-In Self-Test
      6. 11.9.6  Junction Temperature Monitors
      7. 11.9.7  Current Limit
      8. 11.9.8  Loss of Ground (GND)
      9. 11.9.9  Diagnostic Output Pin (DIAG_OUT)
        1. 11.9.9.1 Analog MUX Mode on DIAG_OUT
        2. 11.9.9.2 Digital MUX Mode on DIAG_OUT
          1. 11.9.9.2.1 MUX-Output Control Mode
          2. 11.9.9.2.2 Device Interconnect Mode
      10. 11.9.10 Watchdog
        1. 11.9.10.1 WD Question and Answer Configurations
        2. 11.9.10.2 WD Failure Counter and WD Status
        3. 11.9.10.3 WD SPI Event Definitions
        4. 11.9.10.4 WD Q&A Sequence Run
        5. 11.9.10.5 WD Question and Answer Value Generation
          1. 11.9.10.5.1 WD Initialization Events
      11. 11.9.11 MCU Error Signal Monitor
      12. 11.9.12 NRES Driver
      13. 11.9.13 ENDRV/nIRQ Driver
      14. 11.9.14 CRC Protection for the Device Configuration Registers
      15. 11.9.15 CRC Protection for the Device EEPROM Registers
    10. 11.10 General-Purpose External Supply Voltage Monitors
    11. 11.11 Analog Wake-up and Failure Latch
    12. 11.12 Power-Up and Power-Down Sequences
    13. 11.13 Device Fail-Safe State Controller (Monitoring and Protection)
      1. 11.13.1 OFF State
      2. 11.13.2 INIT State
      3. 11.13.3 RESET State (ON Transition From the INIT State)
      4. 11.13.4 RESET State (ON Transition From DIAGNOSTIC, ACTIVE, and SAFE State)
      5. 11.13.5 DIAGNOSTIC State
      6. 11.13.6 ACTIVE State
      7. 11.13.7 SAFE State
      8. 11.13.8 State Transition Priorities
    14. 11.14 Wakeup
    15. 11.15 Serial Peripheral Interface (SPI)
      1. 11.15.1 SPI Command Transfer Phase
      2. 11.15.2 SPI Data Transfer Phase
      3. 11.15.3 Device SPI Status Flag Response Byte
      4. 11.15.4 Device SPI Data Response
      5. 11.15.5 Device SPI Master CRC (MCRC) Input
      6. 11.15.6 Device SPI Slave CRC (SCRC) Output
      7. 11.15.7 SPI Frame Overview
    16. 11.16 Register Maps
      1. 11.16.1 Device SPI Mapped Registers
        1. 11.16.1.1 Memory Maps
          1. 11.16.1.1.1 SPI Registers
  13. 12Applications, Implementation, and Layout
    1. 12.1 Application Information
    2. 12.2 Typical Application
      1. 12.2.1 Design Requirements
      2. 12.2.2 Detailed Design Procedure
        1. 12.2.2.1  Selecting the BUCK1, BUCK2, and BOOST Output Voltages
        2. 12.2.2.2  Selecting the BUCK1, BUCK2, and BOOST Inductors
        3. 12.2.2.3  Selecting the BUCK1 and BUCK2 Output Capacitors
        4. 12.2.2.4  Selecting the BOOST Output Capacitors
        5. 12.2.2.5  Input Filter Capacitor Selection for BUCK1, BUCK2, and BOOST
        6. 12.2.2.6  Input Filter Capacitors on AVIN and VIN_SAFE Pins
        7. 12.2.2.7  Bootstrap Capacitor Selection
        8. 12.2.2.8  Internal Linear Regulator (VREG) Output Capacitor Selection
        9. 12.2.2.9  EXTSUP Pin
        10. 12.2.2.10 WAKE Input Pin
        11. 12.2.2.11 VIO Supply Pin
        12. 12.2.2.12 External General-Purpose Voltage Monitor Input Pins (EXT_VSENSE1 and EXT_VSENSE2)
        13. 12.2.2.13 SYNC_IN Pin
        14. 12.2.2.14 MCU_ERR Pin
        15. 12.2.2.15 NRES Pin
        16. 12.2.2.16 ENDRV/nIRQ Pin
        17. 12.2.2.17 DIAG_OUT Pin
        18. 12.2.2.18 SPI Pins (NCS,SCK, SDI, SDO)
        19. 12.2.2.19 PBKGx, AGND, DGND, and PGNDx Pins
        20. 12.2.2.20 Calculations for Power Dissipation and Junction Temperature
          1. 12.2.2.20.1 BUCK1 Output Current Calculation
          2. 12.2.2.20.2 Device Power Dissipation Estimation
          3. 12.2.2.20.3 Device Junction Temperature Estimation
            1. 12.2.2.20.3.1 Example for Device Junction Temperature Estimation
      3. 12.2.3 Application Curves
      4. 12.2.4 Layout
        1. 12.2.4.1 Layout Guidelines
        2. 12.2.4.2 Layout Example
        3. 12.2.4.3 Considerations for Board-Level Reliability (BLR)
    3. 12.3 Power Supply Coupling and Bulk Capacitors
  14. 13Device and Documentation Support
    1. 13.1 Documentation Support
      1. 13.1.1 Related Documentation
    2. 13.2 接收文档更新通知
    3. 13.3 支持资源
    4. 13.4 Trademarks
    5. 13.5 静电放电警告
    6. 13.6 术语表
  15. 14Mechanical, Packaging, and Orderable Information

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

WD Question and Answer Value Generation

The 4-bit WD question, WD_QUESTION[3:0], is generated by 4-bit Markov chain process. A Markov chain is a stochastic process with Markov property, which means that state changes are probabilistic, and the future state depends only on the current state. The valid and complete WD answer sequence for each WD Q&A mode is as follows:

  • In WD Q&A multi-answer mode:
    1. Three correct SPI WD answers are received during RESPONSE WINDOW 1.
    2. One correct SPI WD answer is received during RESPONSE WINDOW 2.
    3. In addition to the previously listed timing, the sequence of four responses shall be correct.
  • In WD Q&A single-answer mode:
    1. No SPI WD answer is received during the CLOSE WINDOW.
    2. One correct SPI WD answer is received during the OPEN WINDOW.

The WD question value is latched in the WD_QUESTION[3:0] bits of the WDT_QUESTION_VALUE register and can be read out at any time.

GUID-1BE4B231-37B1-46B7-976F-9E00B9CFD0AB-low.gif
  1. If the current y value is 0000, the next y value will be 0001. The next watchdog question generation process starts from that value.
Figure 11-18 Watchdog Question Generation
Table 11-10 Set of WD Questions and Corresponding WD Answers Using Default Setting
QUESTION IN WD_QUESTION_VALUE REGISTER WD ANSWER BYTES (EACH BYTE TO BE WRITTEN INTO WDT_ANSWER REGISTER)
WD_ANSWER_RESP_3 WD_ANSWER_RESP_2 WD_ANSWER_RESP_1(1) WD_ANSWER_RESP_0
WD_QUESTION WD_ANSW_CNT[1:0] 11b WD_ANSW_CNT[1:0] 10b WD_ANSW_CNT[1:0] 01b WD_ANSW_CNT[1:0] 00b
0x0 0xFF 0x0F 0xF0 0x00
0x1 0xB0 0x40 0xBF 0x4F
0x2 0xE9 0x19 0xE6 0x16
0x3 0xA6 0x56 0xA9 0x59
0x4 0x75 0x85 0x7A 0x8A
0x5 0x3A 0xCA 0x35 0xC5
0x6 0x63 0x93 0x6C 0x9C
0x7 0x2C 0xDC 0x23 0xD3
0x8 0xD2 0x22 0xDD 0x2D
0x9 0x9D 0x6D 0x92 0x62
0xA 0xC4 0x34 0xCB 0x3B
0xB 0x8B 0x7B 0x84 0x74
0xC 0x58 0xA8 0x57 0xA7
0xD 0x17 0xE7 0x18 0xE8
0xE 0x4E 0xBE 0x41 0xB1
0xF 0x01 0xF1 0x0E 0xFE
This option is used for the WD Q&A Single-Answer mode (the WD_CFG bit is set to 1b).
GUID-9AC78FE3-2456-467E-AB26-167D1013AEE3-low.gif Figure 11-19 WD Expected Answer Generation
Table 11-11 Correct and Incorrect WD Q&A Sequence Run Scenarios for WD Q&A Multi-Answer Mode (WD_CFG = 0b)
NUMBER OF WD ANSWERS ACTION WD STATUS BITS IN WDT_STATUS REGISTER COMMENTS
RESPONSE
WINDOW 1
RESPONSE
WINDOW 2
ANSW_ERR ANSW_EARLY SEQ_ERR TIME_OUT
0 answer 0 answer -New WD cycle starts after the end of RESPONSE WINDOW 2
-Increment WD failure counter
-New WD cycle starts with the same WD question
0b 0b 1b 1b No answers
0 answer 4 INCORRECT answer -New WD cycle starts after the 4th WD answer
-Increment WD failure counter
-New WD cycle starts with the same WD question
1b 0b 1b 0b Total WD_ANSW_CNT[1:0] = 4
0 answer 4 CORRECT answer -New WD cycle starts after the 4th WD answer
-Increment WD failure counter
-New WD cycle starts with the same WD question
0b 0b 1b 0b Total WD_ANSW_CNT[1:0] = 4
0 answer 1 CORRECT answer -New WD cycle starts after the end of RESPONSE WINDOW 2
-Increment WD failure counter
-New WD cycle starts with the same WD question
0b 0b 1b 1b Less than 3 CORRECT ANSWER in RESPONSE WINDOW 1 and 1 CORRECT ANSWER in RESPONSE WINDOW 2 (Total WD_ANSW_CNT[1:0] < 4)
1 CORRECT answer 1 CORRECT answer
2 CORRECT answer 1 CORRECT answer
0 answer 1 INCORRECT answer -New WD cycle starts after the end of RESPONSE WINDOW 2
-Increment WD failure counter
-New WD cycle starts with the same WD question
1b 0b 1b 1b Less than 3 CORRECT ANSWER in RESPONSE WINDOW 1 and 1 INCORRECT ANSWER in RESPONSE WINDOW 2 (Total WD_ANSW_CNT[1:0] < 4)
1 CORRECT answer 1 INCORRECT answer
2 CORRECT answer 1 INCORRECT answer
0 answer 4 CORRECT answer -New WD cycle starts after the 4th WD answer
-Increment WD failure counter
-New WD cycle starts with the same WD question
0b 0b 1b 0b Less than 3 CORRECT ANSWER in WIN1 and more than 1 CORRECT ANSWER in RESPONSE WINDOW 2 (Total WD_ANSW_CNT[1:0] = 4)
1 CORRECT answer 3 CORRECT answer
2 CORRECT answer 2 CORRECT answer
0 answer 4 INCORRECT answer -New WD cycle starts after the 4th WD answer
-Increment WD failure counter
-New WD cycle starts with the same WD question
1b 0b 1b 0b Less than 3 CORRECT ANSWER in RESPONSE WINDOW 1 and more than 1 INCORRECT ANSWER in RESPONSE WINDOW 2 (Total WD_ANSW_CNT[1:0] = 4)
1 CORRECT answer 3 INCORRECT answer
2 CORRECT answer 2 INCORRECT answer
0 answer 3 CORRECT answer -New WD cycle starts after the end of RESPONSE WINDOW 2
-Increment WD failure counter
-New WD cycle starts with the same WD question
0b 0b 1b 1b Less than 3 INCORRECT ANSWER in RESPONSE WINDOW 1 and more than 1 CORRECT ANSWER in RESPONSE WINDOW 2 (Total WD_ANSW_CNT[1:0] < 4)
1 INCORRECT answer 2 CORRECT answer -New WD cycle starts after the end of RESPONSE WINDOW 2
-Increment WD failure counter
-New WD cycle starts with the same WD question
1b 0b 1b 1b
2 INCORRECT answer 1 CORRECT answer
0 answer 3 INCORRECT answer -New WD cycle starts after the end of RESPONSE WINDOW 2
-Increment WD failure counter
-New WD cycle starts with the same WD question
1b 0b 1b 1b Less than 3 INCORRECT ANSWER in RESPONSE WINDOW 1 and more than 1 INCORRECT ANSWER in RESPONSE WINDOW 2 (Total WD_ANSW_CNT[1:0] < 4)
1 INCORRECT answer 2 INCORRECT answer
2 INCORRECT answer 1 INCORRECT answer
0 answer 4 CORRECT answer -New WD cycle starts after the 4th WD answer
-Increment WD failure counter
-New WD cycle starts with the same WD question
0b 0b 1b 0b Less than 3 INCORRECT ANSWER in RESPONSE WINDOW 1 and more than 1 CORRECT ANSWER in RESPONSE WINDOW 2 (Total WD_ANSW_CNT[1:0] = 4)
1 INCORRECT answer 3 CORRECT answer 1b 0b 1b 0b
2 INCORRECT answer 2 CORRECT answer
0 answer 4 INCORRECT answer -New WD cycle starts after the 4th WD answer
-Increment WD failure counter
-New WD cycle starts with the same WD question
1b 0b 1b 0b Less than 3 INCORRECT ANSWER in RESPONSE WINDOW 1 and more than 1 INCORRECT ANSWER in RESPONSE WINDOW 2 (Total WD_ANSW_CNT[1:0] = 4)
1 INCORRECT answer 3 INCORRECT answer
2 INCORRECT answer 2 INCORRECT answer
3 CORRECT answer 0 answer -New WD cycle starts after the end of RESPONSE WINDOW 2
-Increment WD failure counter
-New WD cycle starts with the same WD Question
0b 0b 0b 1b Less than 4 CORRECT ANSW in RESPONSE WINDOW 1 and more than 0 ANSWER in RESPONSE WINDOW 2 (Total WD_ANSW_CNT[1:0] < 4)
2 CORRECT answer 0 answer 0b 0b 1b 1b
1 CORRECT answer 0 answer
3 CORRECT answer 1 CORRECT answer -New WD cycle starts after the 4th WD answer
-Decrement WD failure counter
-New WD cycle starts with a new WD question
0b 0b 0b 0b CORRECT SEQUENCE
3 CORRECT answer 1 INCORRECT answer -New WD cycle starts after the 4th WD answer
-Increment WD failure counter
-New WD cycle starts with the same WD question
1b 0b 0b 0b Total WD_ANSW_CNT[1:0] = 4
3 INCORRECT answer 0 answer -New WD cycle starts after the end of RESPONSE WINDOW 2
-Increment WD failure counter
-New WD cycle starts with the same WD question
1b 0b 0b 1b Total WD_ANSW_CNT[1:0] < 4
3 INCORRECT answer 1 CORRECT answer -New WD cycle starts after the 4th WD answer
-Increment WD failure counter
-New WD cycle starts with the same WD question
1b 0b 0b 0b Total WD_ANSW_CNT[1:0] = 4
3 INCORRECT answer 1 INCORRECT answer -New WD cycle starts after the 4th WD answer
-Increment WD failure counter
-New WD cycle starts with the same WD question
1b 0b 0b 0b Total WD_ANSW_CNT[1:0] = 4
4 CORRECT answer Not applicable -New WD cycle starts after the 4th WD answer
-Increment WD failure counter
-New WD cycle starts with the same WD question
0b 1b 0b 0b
3 CORRECT answer + 1 INCORRECT answer Not applicable -New WD cycle starts after the 4th WD answer
-Increment WD failure counter
-New WD cycle starts with the same WD question
1b 1b 0b 0b 4 CORRECT or INCORRECT ANSWER in RESPONSE WINDOW 1
2 CORRECT answer + 2 NCORRECT answer Not applicable
1 CORRECT answer + 3 NCORRECT answer Not applicable
Table 11-12 Correct and Incorrect WD Q&A Sequence Run Scenarios for WD Q&A Single-Answer Mode
NUMBER OF WD ANSWERS AND TIMING ACTION WD STATUS BITS IN WDT_STATUS REGISTER
CLOSE WINDOW OPEN WINDOW ANSW_ERR ANSW_EARLY SEQ_ERR TIME_OUT
0 answer 0 answer -New WD cycle starts after the end of WIN2
-Increment WD failure counter
-New WD cycle starts with the same WD question
0b 0b 0b 1b
1 CORRECT answer 0 answer -New WD cycle starts after the end of RESPONSE WINDOW 1
-Increment WD failure counter
-New WD cycle starts with the same WD question
0b 1b 0b 0b
1 INCORRECT answer 0 answer -New WD cycle starts after the end of RESPONSE WINDOW 1
-Increment WD failure counter
-New WD cycle starts with the same WD question
1b 1b 0b 0b
0 answer 1 CORRECT answer -New WD cycle starts after the end of RESPONSE WINDOW 2
-Decrement WD failure counter
-New WD cycle starts with the same WD question
0b 0b 0b 0b
0 answer 1 INCORRECT answer -New WD cycle starts after the end of RESPONSE WINDOW 2
-Increment WD failure counter
-New WD cycle starts with the same WD question
1b 0b 0b 0b

The watchdog status bits (ANSW_ERR, ANSW_EARLY, SEQ_ERR, and TIME_OUT) in the WDT_STATUS register are updated at the end of each WD cycle. Read access to the WDT_STATUS register during an active WD cycle returns the status of previous WD cycle and clears the WD status bits.