ZHCSB17D february   2013  – july 2023 TUSB8040A1

PRODUCTION DATA  

  1.   1
  2. 1特性
  3. 2应用
  4. 3说明
  5. 4Revision History
  6. 5Pin Configuration and Functions
  7. 6Specifications
    1. 6.1 Absolute Maximum Ratings #GUID-9FC00080-214A-41B8-A47D-B9F7BA87DE22/SLLSE42922
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 3.3-V I/O Electrical Characteristics
    6. 6.6 Hub Input Supply Current
    7. 6.7 Timing and Switching Characteristics
      1. 6.7.1 Clock Generation
      2. 6.7.2 Crystal Requirements
      3. 6.7.3 Input Clock Requirements
  8. 7Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Memory
    4. 7.4 I2C EEPROM Operation
    5. 7.5 SMBus Target Operation
    6. 7.6 Configuration Registers
      1. 7.6.1  ROM Signature Register
      2. 7.6.2  Vendor ID LSB Register
      3. 7.6.3  Vendor ID MSB Register
      4. 7.6.4  Product ID LSB Register
      5. 7.6.5  Product ID MSB Register
      6. 7.6.6  Device Configuration Register
      7. 7.6.7  Battery Charging Support Register
      8. 7.6.8  Device Removable Configuration Register
      9. 7.6.9  Port Used Configuration Register
      10. 7.6.10 Reserved Register
      11. 7.6.11 Reserved Register
      12. 7.6.12 Language ID LSB Register
      13. 7.6.13 Language ID MSB Register
      14. 7.6.14 Serial Number String Length Register
      15. 7.6.15 Manufacturer String Length Register
      16. 7.6.16 Product String Length Register
      17. 7.6.17 Reserved Register
      18. 7.6.18 Serial Number Registers
      19. 7.6.19 Manufacturer String Registers
      20. 7.6.20 Product String Registers
      21. 7.6.21 Additional Feature Configuration Register
      22. 7.6.22 Reserved Register
      23. 7.6.23 Reserved Register
      24. 7.6.24 Device Status and Command Register
  9. 8Applications, Implementation, and Layout
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Upstream Port Implementation
        2. 8.2.2.2 Downstream Port 1 Implementation
        3. 8.2.2.3 Downstream Port 2 Implementation
        4. 8.2.2.4 Downstream Port 3 Implementation
        5. 8.2.2.5 Downstream Port 4 Implementation
        6. 8.2.2.6 VBUS Power Switch Implementation
        7. 8.2.2.7 Clock, Reset, I2C/SMBUS, and Misc
        8. 8.2.2.8 Power Implementation
      3. 8.2.3 Application Curve
      4. 8.2.4 Power Supply Recommendations
        1. 8.2.4.1 Power Up and Reset
      5. 8.2.5 Layout
        1. 8.2.5.1 Layout Guidelines
          1. 8.2.5.1.1 Part Placement
          2. 8.2.5.1.2 Board Layout Considerations
            1. 8.2.5.1.2.1  RKM Package – QFN (Quad Flat No-Lead)
            2. 8.2.5.1.2.2  Impedance
            3. 8.2.5.1.2.3  Critical Signals
            4. 8.2.5.1.2.4  Crystal
            5. 8.2.5.1.2.5  USB Interface
            6. 8.2.5.1.2.6  Differential Pair Signals
              1. 8.2.5.1.2.6.1 Internal Bond Wire Mismatch
            7. 8.2.5.1.2.7  Port Connectors
            8. 8.2.5.1.2.8  Reset Terminals
            9. 8.2.5.1.2.9  Miscellaneous Terminals
            10. 8.2.5.1.2.10 Power Control and Battery Charging Terminals
            11. 8.2.5.1.2.11 USB 2.0 Port Indicator LED Terminals
          3. 8.2.5.1.3 Power
            1. 8.2.5.1.3.1 Power
            2. 8.2.5.1.3.2 Downstream Port Power
            3. 8.2.5.1.3.3 Ground
        2. 8.2.5.2 Layout Example
  10. 9Device and Documentation Support
    1. 9.1 接收文档更新通知
    2. 9.2 支持资源
    3. 9.3 Trademarks
    4. 9.4 静电放电警告
    5. 9.5 术语表
  11.   Mechanical, Packaging, and Orderable Information

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6.1 Absolute Maximum Ratings(1)

over operating free-air temperature range (unless otherwise noted)
MINMAXUNIT
VDD33Steady-state supply voltage–0.33.8V
VDD11–0.31.4
VIOUSB 2.0 DP/DM–0.3VDD33 + 0.3 ≤ 3.V
SuperSpeed USB TXP/M and RXP/M–0.3VDD33 + 0.3 ≤ 3.8
XI/XO–0.31.98
3.3-V Tolerant I/O–0.3VDD33 + 0.3 ≤ 3.8
VUSB_VBUS–0.31.2V
TstgStorage temperature range–65150°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Section 6.3 is not implied. Expose to absolute-maximum-rated conditions for extended periods may affect device reliability