SPRK066 October 2025 F28377D-SEP
Two types of transients were observed during testing of the GPIOs. These are referred to in subsequent sections as Type 1 and Type 2 upsets respectively.
Type 1 upsets occurred local to the GPIO, either in combination with other IOs or as a singular event. In either case these resolved either immediately or after some time duration as shown in Figure 8-5.
Figure 8-5 Type 1 Transient(SEU) For
GPIOType 2 upsets were a result of impact to the system code execution, which in turn led to a trigger of the on-chip Watchdog or NMI Watchdog, meant to reset the system in case of a fault. In this case no fault handling was in place for these events, such that if the watchdog timed out or there was a system level NMI, the system was allowed to reset, and subsequently re-boot to flash. In all cases of a Type 2 upset, the system recovered and GPIO output resumed as expected.
Figure 8-6 Type 2 Transient (Recoverable SEFI) For GPIO