SPRK066 October   2025 F28377D-SEP

1.   1
2.   F28377D-SEP Abstract
3.   Trademarks
4. 1Introduction
5. 2Single-Event Effects (SEE)
6. 3Device and Test Board Information
7. 4Irradiation Facility and Setup
8. 5Depth, Range, and LETEFF Calculation
9. 6Test Setup and Procedures
10. 7Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
11. 8Single-Event Transients (SET)
    1. 8.1 GPIO Testing and Results
       1. 8.1.1 GPIO Test Setup
       2. 8.1.2 GPIO SET Analysis
       3. 8.1.3 GPIO SET Summary
    2. 8.2 ePWM Testing and Results
       1. 8.2.1 ePWM Testing Setup
       2. 8.2.2 ePWM SET Analysis
       3. 8.2.3 ePWM SET Summary
    3. 8.3 SRAM Testing and Results
       1. 8.3.1 SRAM Test Setup
       2. 8.3.2 SRAM SET Summary
    4. 8.4 Flash Memory Testing and Results
       1. 8.4.1 Flash Test Setup
       2. 8.4.2 Flash SET Summary
12. 9Summary
13.   A Total Ionizing Dose from SEE Experiments
14.   B References