SPRK066 October   2025 F28377D-SEP

 

  1.   1
  2.   F28377D-SEP Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Depth, Range, and LETEFF Calculation
  9. 6Test Setup and Procedures
  10. 7Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
  11. 8Single-Event Transients (SET)
    1. 8.1 GPIO Testing and Results
      1. 8.1.1 GPIO Test Setup
      2. 8.1.2 GPIO SET Analysis
      3. 8.1.3 GPIO SET Summary
    2. 8.2 ePWM Testing and Results
      1. 8.2.1 ePWM Testing Setup
      2. 8.2.2 ePWM SET Analysis
      3. 8.2.3 ePWM SET Summary
    3. 8.3 SRAM Testing and Results
      1. 8.3.1 SRAM Test Setup
      2. 8.3.2 SRAM SET Summary
    4. 8.4 Flash Memory Testing and Results
      1. 8.4.1 Flash Test Setup
      2. 8.4.2 Flash SET Summary
  12. 9Summary
  13.   A Total Ionizing Dose from SEE Experiments
  14.   B References

8.1.3 GPIO SET Summary

The transient event counts and event cross sections are shown in Table 8-7 for the different test procedures outlined previously. Key takeaways as follows:

  • All faults observed are either temporary or were recoverable with a reset to the system
  • The values written to the GPIO data registers, internal to the device, during the static output test were not-effected/did not show correlation to the output state change in the IO. This implies that the SET was local to the output/input buffer itself, versus to the internal logic that controls the IO signal.
Table 8-2 GPIO Transient Upset Summary
Test Pattern LETEFF(MeV·cm2/mg Ion Type Transient Type Event Count Fluence (# of ions) Cross Section(Event Count/LETEFF
CPU Timer 45 109Ag Type 1 23 1.01 E5 2.29 E-5
CPU Timer 8.5 40Ar Type 1 20 1.00 E5 1.98 E-5
CPU Timer 45 109Ag Type 2 83 1.01 E5 8.26 E-5
CPU Timer 8.5 40Ar Type 2 25 1.00 E5 2.44 E-5
HB 45 109Ag Type 1 54 1.01 E5 5.37 E-5
HB 8.5 40Ar Type 1 13 1.00 E5 1.26 E-5
HB 45 109Ag Type 2 65 1.01 E5 6.47 E-5
HB 8.5 40Ar Type 2 19 1.00 E5 1.84 E-5
XINT 45 109Ag Type 1 294 1.01 E5 2.92 E-4
XINT 8.5 40Ar Type 1 14 1.00 E5 1.38 E-5
XINT 45 109Ag Type 2 105 1.01 E5 1.04 E-4
XINT 8.5 40Ar Type 2 19 1.00 E5 1.88 E-5