SPRK066 October   2025 F28377D-SEP

 

  1.   1
  2.   F28377D-SEP Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Depth, Range, and LETEFF Calculation
  9. 6Test Setup and Procedures
  10. 7Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
  11. 8Single-Event Transients (SET)
    1. 8.1 GPIO Testing and Results
      1. 8.1.1 GPIO Test Setup
      2. 8.1.2 GPIO SET Analysis
      3. 8.1.3 GPIO SET Summary
    2. 8.2 ePWM Testing and Results
      1. 8.2.1 ePWM Testing Setup
      2. 8.2.2 ePWM SET Analysis
      3. 8.2.3 ePWM SET Summary
    3. 8.3 SRAM Testing and Results
      1. 8.3.1 SRAM Test Setup
      2. 8.3.2 SRAM SET Summary
    4. 8.4 Flash Memory Testing and Results
      1. 8.4.1 Flash Test Setup
      2. 8.4.2 Flash SET Summary
  12. 9Summary
  13.   A Total Ionizing Dose from SEE Experiments
  14.   B References

ePWM Testing and Results

EPWM modules are highly programmable, extremely flexible, and easy to use, while being capable of generating complex pulse width waveforms with minimal CPU overhead or intervention. Each EPWM module is identical with two PWM outputs, EPWMxA and EPWMxB. Multiple EPWM modules can be synchronized to operate together as needed within a system (please refer to your device’s documentation on the specific order of the EPWM module synchronization scheme). The generated PWM waveforms are available as outputs on GPIO pins on the microcontroller.

The EPWM module can also interact closely with other peripherals. For example, EPWM’s can trigger ADC start-of-conversion (SOC) signals, and EPWM’s can generate interrupts to the interrupt controller block. External signals can also be used to alter an EPWM output, if needed, as well as generate interrupts. Additionally, the outputs of comparators on the device can be used as inputs to the EPWM by leveraging connectivity through the EPWM X-BAR module.