SLAAET8A April   2025  – December 2025 MSPM0C1103 , MSPM0C1103-Q1 , MSPM0C1104 , MSPM0C1104-Q1 , MSPM0C1105 , MSPM0C1106 , MSPM0C1106-Q1 , MSPM0G1105 , MSPM0G1106 , MSPM0G1107 , MSPM0G1505 , MSPM0G1506 , MSPM0G1507 , MSPM0G1518 , MSPM0G1519 , MSPM0G3105 , MSPM0G3105-Q1 , MSPM0G3106 , MSPM0G3106-Q1 , MSPM0G3107 , MSPM0G3107-Q1 , MSPM0G3505 , MSPM0G3505-Q1 , MSPM0G3506 , MSPM0G3506-Q1 , MSPM0G3507 , MSPM0G3507-Q1 , MSPM0G3518 , MSPM0G3518-Q1 , MSPM0G3519 , MSPM0G3519-Q1 , MSPM0G3529-Q1 , MSPM0H3216 , MSPM0H3216-Q1 , MSPM0L1105 , MSPM0L1106 , MSPM0L1116 , MSPM0L1117 , MSPM0L1227 , MSPM0L1227-Q1 , MSPM0L1228 , MSPM0L1228-Q1 , MSPM0L1303 , MSPM0L1304 , MSPM0L1304-Q1 , MSPM0L1305 , MSPM0L1305-Q1 , MSPM0L1306 , MSPM0L1306-Q1 , MSPM0L1343 , MSPM0L1344 , MSPM0L1345 , MSPM0L1346 , MSPM0L2227 , MSPM0L2227-Q1 , MSPM0L2228 , MSPM0L2228-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2EMC and EMC Standards
    1. 2.1 EMC
      1. 2.1.1 EMS
      2. 2.1.2 EMI
    2. 2.2 EMC Standards
      1. 2.2.1 EMC Standards Category
    3. 2.3 EMC and IC Electrical Reliability in TI
  6. 3EMC Improvement Guidelines Summary
    1. 3.1 PCB Design Guidelines
    2. 3.2 Firmware Guidelines
  7. 4EMC Improvement Features on MSPM0
    1. 4.1 Susceptibility Protection Features
      1. 4.1.1 POR and BOR
      2. 4.1.2 NMI and Hard Fault
      3. 4.1.3 I/O ESD and Settings
    2. 4.2 Emission Reduction Features
      1. 4.2.1 Clock Source
      2. 4.2.2 Power Modes
      3. 4.2.3 Package
  8. 5Analysis for EMS Test
    1. 5.1 Root Cause Analysis
      1. 5.1.1 Permanent Damage
      2. 5.1.2 Recoverable Malfunction
    2. 5.2 Debug Flow
  9. 6Analysis for EMI Test
    1. 6.1 Root Cause Analysis
      1. 6.1.1 Power Line
      2. 6.1.2 External Vcore
    2. 6.2 Debug Flow
  10. 7Summary
  11. 8References
  12. 9Revision History

1 Introduction

This document presents an overview of Electromagnetic Compatibility (EMC) principles, standards, and implementation strategies for MSPM0 microcontrollers. Most of the content is provided in the checklist format.

Before product development with MSPM0, TI recommends to read these sections to have a better understanding to improve EMC in MSPM0-based systems from both software and hardware level.

When there is failure in EMC test, TI recommends to read these sections below to find the root cause and resolutions.