SLAAET8A April   2025  – December 2025 MSPM0C1103 , MSPM0C1103-Q1 , MSPM0C1104 , MSPM0C1104-Q1 , MSPM0C1105 , MSPM0C1106 , MSPM0C1106-Q1 , MSPM0G1105 , MSPM0G1106 , MSPM0G1107 , MSPM0G1505 , MSPM0G1506 , MSPM0G1507 , MSPM0G1518 , MSPM0G1519 , MSPM0G3105 , MSPM0G3105-Q1 , MSPM0G3106 , MSPM0G3106-Q1 , MSPM0G3107 , MSPM0G3107-Q1 , MSPM0G3505 , MSPM0G3505-Q1 , MSPM0G3506 , MSPM0G3506-Q1 , MSPM0G3507 , MSPM0G3507-Q1 , MSPM0G3518 , MSPM0G3518-Q1 , MSPM0G3519 , MSPM0G3519-Q1 , MSPM0G3529-Q1 , MSPM0H3216 , MSPM0H3216-Q1 , MSPM0L1105 , MSPM0L1106 , MSPM0L1116 , MSPM0L1117 , MSPM0L1227 , MSPM0L1227-Q1 , MSPM0L1228 , MSPM0L1228-Q1 , MSPM0L1303 , MSPM0L1304 , MSPM0L1304-Q1 , MSPM0L1305 , MSPM0L1305-Q1 , MSPM0L1306 , MSPM0L1306-Q1 , MSPM0L1343 , MSPM0L1344 , MSPM0L1345 , MSPM0L1346 , MSPM0L2227 , MSPM0L2227-Q1 , MSPM0L2228 , MSPM0L2228-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2EMC and EMC Standards
    1. 2.1 EMC
      1. 2.1.1 EMS
      2. 2.1.2 EMI
    2. 2.2 EMC Standards
      1. 2.2.1 EMC Standards Category
    3. 2.3 EMC and IC Electrical Reliability in TI
  6. 3EMC Improvement Guidelines Summary
    1. 3.1 PCB Design Guidelines
    2. 3.2 Firmware Guidelines
  7. 4EMC Improvement Features on MSPM0
    1. 4.1 Susceptibility Protection Features
      1. 4.1.1 POR and BOR
      2. 4.1.2 NMI and Hard Fault
      3. 4.1.3 I/O ESD and Settings
    2. 4.2 Emission Reduction Features
      1. 4.2.1 Clock Source
      2. 4.2.2 Power Modes
      3. 4.2.3 Package
  8. 5Analysis for EMS Test
    1. 5.1 Root Cause Analysis
      1. 5.1.1 Permanent Damage
      2. 5.1.2 Recoverable Malfunction
    2. 5.2 Debug Flow
  9. 6Analysis for EMI Test
    1. 6.1 Root Cause Analysis
      1. 6.1.1 Power Line
      2. 6.1.2 External Vcore
    2. 6.2 Debug Flow
  10. 7Summary
  11. 8References
  12. 9Revision History

2.2.1 EMC Standards Category

The following section shows the EMC test coverage based on different EMC standards created by these organizations. First, use the IEC 610000 series as an example to show what EMS testing covers.

Table 2-1 EMS (Immunity) Testing Standards Overview
Test Type Standard Purpose Test Method Application Scope
ESD Immunity

IEC 61000-4-2

Evaluate immunity to electrostatic discharges from human/machine contact.
  • Contact discharge (approximately 2kV-8kV); air discharge (approximately 2kV-15kV).
  • Use an ESD Gun.
 Consumer electronics, industrial equipment.
EFT/Burst Immunity IEC 61000-4-4 Test immunity to fast transient disturbances (for example, relay switching).
  • Approximately 50ns pulse bursts (0.5kV to 4kV, 5kHz repetition).
  • Coupled to power or signal lines by capacitive clamp.
 Power supplies, motor drives, control systems.
Surge Immunity IEC 61000-4-5 Assess immunity to high-energy surges (for example, lightning, load switching).
  • Approximately 50μs voltage surge (line-to-line or line-to-ground, 0.5kV to 4kV).
  • Coupled via CDN or gas discharge tube.
 Telecom systems, grid-connected devices.
Radiated RF Immunity IEC 61000-4-3 Test immunity to radiated RF fields (for example, radio transmitters).
  • RF signals (80MHz–6GHz) with a uniform field area (3V/m–30V/m).
  • Radiated by antenna at 3m distances.
 Wireless devices, automotive electronics.
Conducted RF Immunity IEC 61000-4-6 Evaluates immunity to RF interference coupled via cables/power lines.
  • RF signals (150kHz–80MHz) with modulation (80% AM at 1kHz).
  • Injected via CDN or current clamp.
 Medical devices, industrial automation.

Here are some EMI test standards listed to show what EMI testing covers. Compared with EMS, for EMI, the test standards and protection level is related to application.

Table 2-2 EMI (Electromagnetic Interference) Testing Standards Overview
Test Type Standard Purpose Test Method Application Scope
Radiated Emission CISPR 25 Evaluates radiated emissions from automotive electronics
  • RF signals (30MHz–1GHz).
  • Conducted in an anechoic chamber with antennas at 1m/3m/10m distances.
 In-vehicle systems.
Conducted Emission CISPR 22/32 Tests conducted emissions on power/signal lines.
  • RF signals (150kHz–30MHz).
  • Uses LISN to measure quasi-peak and average values.
 Power adapters, industrial frequency converters.