SBAK043 April   2026 DAC39RF10-SP , DAC39RFS10-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Test Setup and Procedures
  9. 6Single-Event Latch-Up (SEL) Results
  10. 7Single-Event Functional Interrupt (SEFI) Results
    1. 7.1 Converter Performance and Digital (DUC + JESD204C Link) Hardness
    2. 7.2 Configuration Register Hardness
    3. 7.3 SPI Programming During Irradiation
  11. 8SEU Results
    1. 8.1 JESD204C Link Monitoring Results
    2. 8.2 Digital Up-Converter and NCO Upset Recovery
    3. 8.3 Estimating Upset Rates in Unprotected Data Paths
    4. 8.4 Event Rate Calculations
    5. 8.5 Summary of Radiation Hardness
  12. 9References
  13.   A Appendix: Recommendations for Hi-Rel Systems
    1.     A.1 Summary of Rad-Hard Design Features
    2.     A.2 SPI Programming
    3.     A.3 JESD204C Reliability
    4.     A.4 Equalizer Usage in Radiation Environments
    5.     A.5 NCO Reliability
    6.     A.6 NCO Frequency and Phase Correction (Strategy #1)
    7.     A.7 NCO Frequency Correction (Strategy #2)
    8.     A.8 NCO Self-Sync/Self-Coherent Mode (Strategy #3)

6 Single-Event Latch-Up (SEL) Results

For SEL testing, the DAC39RF10-SP is biased to the datasheet maximum recommended supply voltages (+5% of the nominal values): VEE = -1.89V; VAx18 = VDD18 = 1.89V; VAx10 = VDD10 = 1.05V (the nominal supply voltages are VEE = -1.8V; VAx18 = VDD18 = 1.8V; VAx10 = VDD10 = 1.0V), and the die is heated externally to a junction temperature of >125°C. The die temperature was monitored using the on-die temperature sensor.

We also checked for SEL marginality on the DAC39RF10-SP using supply voltages set to +10% of the nominal voltages: VEE = -1.21V; VAx18 = VDD18 = 2.1V; VAx10 = VDD10 = 1.21V.

The species used for the SEL testing were gold (197Au) ions and an angle of 45° to achieve an LETEFF of >120 MeV·cm2/mg. Ion flux target was set to 105 ions/cm2·s and we ran to a fluence of 107 ions/cm2. The SEL run is typically repeated to achieve a total fluence of 2e7 ions/cm2 per DUT. No SEL events were observed during any beam runs across four different DUTs, indicating that the DAC39RF10-SP is SEL-free. Table 6-1 shows the SEL run conditions.

Table 6-1 SEL Run Conditions
Test IDDUT #Supply RailsTj (℃)Beam Ion

Angle (°)

LETEFF (MeV-cm2/mg)Flux (ions·cm2/s)Fluence (ions·cm2)SEL Observed?Device cfg
2022.06.02-062264+5%130Au451211.00 × 1051.00 × 107NoJMODE3
2022.06.02-112264+10%140Au451211.00 × 1051.00 × 107NoJMODE3
2022.06.02-132269+5%136Au451211.00 × 1051.00 × 107NoJMODE3
2022.06.02-162269+10%143Au451211.00 × 1051.00 × 107NoJMODE3
2023.09.12-0123010%109Au451211.00 × 1051.00 × 107NoJMODE3
2023.09.12-022301+5%121Au451211.00 × 1052.00 × 107NoJMODE3
2023.09.12-032301+10%131Au451211.00 × 1052.00 × 107NoJMODE3
2023.09.12-042303+5%122Au451211.00 × 1052.00 × 107NoJMODE3
2023.09.12-052303+10%134Au451211.00 × 1052.00 × 107NoJMODE3
DAC39RF10-SP Current During SEL Run 2023.09.12-03Figure 6-1 DAC39RF10-SP Current During SEL Run 2023.09.12-03
Note: The digital supply current is plotted separately since it consumes more current than other rails. You can observe minor fluctuations in current when the beam is active.