SBAK043 April   2026 DAC39RF10-SP , DAC39RFS10-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Test Setup and Procedures
  9. 6Single-Event Latch-Up (SEL) Results
  10. 7Single-Event Functional Interrupt (SEFI) Results
    1. 7.1 Converter Performance and Digital (DUC + JESD204C Link) Hardness
    2. 7.2 Configuration Register Hardness
    3. 7.3 SPI Programming During Irradiation
  11. 8SEU Results
    1. 8.1 JESD204C Link Monitoring Results
    2. 8.2 Digital Up-Converter and NCO Upset Recovery
    3. 8.3 Estimating Upset Rates in Unprotected Data Paths
    4. 8.4 Event Rate Calculations
    5. 8.5 Summary of Radiation Hardness
  12. 9References
  13.   A Appendix: Recommendations for Hi-Rel Systems
    1.     A.1 Summary of Rad-Hard Design Features
    2.     A.2 SPI Programming
    3.     A.3 JESD204C Reliability
    4.     A.4 Equalizer Usage in Radiation Environments
    5.     A.5 NCO Reliability
    6.     A.6 NCO Frequency and Phase Correction (Strategy #1)
    7.     A.7 NCO Frequency Correction (Strategy #2)
    8.     A.8 NCO Self-Sync/Self-Coherent Mode (Strategy #3)

Configuration Register Hardness

The DAC was configured in an active conversion mode then all SPI registers were read, and the register contents were stored. After the beam run, the read-all register command was initiated, and the register contents were stored yet again. The pre- and post- SPI register dumps were then compared to ensure no values were changing due to ion strikes.

The only values changing are sticky alarms that need to be cleared manually (for example, 0x107 JESD_STATUS; 0x160–0x16F LANE_ERR; 0x410 SYNC_STATUS; 0x430 SYS_ALM). This result is not unexpected as these are read-only SPI status registers associated with JESD204C physical or link layers or write-to-clear status bits that get set when certain events occur in upset-vulnerable logic (an upset can cause an event to occur that gets detected and sets the sticky bit). All user programmable device configuration and fuse-backed register values remain unchanged after beam runs. See the appendix for more details.

 Pre- and Post-Beam Run (TestID
                    2022.06.02-04) SPI Register Dump Comparison Figure 7-3 Pre- and Post-Beam Run (TestID 2022.06.02-04) SPI Register Dump Comparison