SLVUBG5A June   2018  – September 2021 ESD122 , ESD204 , ESD401 , SN65220 , SN65240 , TPD1E01B04 , TPD1E04U04 , TPD1E05U06 , TPD1E10B06 , TPD1E10B06-Q1 , TPD1E10B09 , TPD1E10B09-Q1 , TPD2E001 , TPD2E001-Q1 , TPD2E009 , TPD2E1B06 , TPD2E2U06-Q1 , TPD2EUSB30 , TPD2S017 , TPD4E001-Q1 , TPD4E004 , TPD4E02B04 , TPD4E05U06 , TPD4E05U06-Q1 , TPD4E101 , TPD4E1B06 , TPD4E1U06 , TPD4E6B06 , TPD5E003 , TPD6E001 , TPD6E004 , TPD6E05U06 , TPD8E003 , TPD8S009 , TVS2200 , UC1611-SP , UC2610 , UC3610 , UC3611 , UC3611M

 

  1.   Trademarks
  2. 1Introduction
  3. 2Definitions
  4. 3S-Parameter Analysis
    1. 3.1 DQA 4-Port Analysis
  5. 4Lower Speed Device Testing
    1. 4.1 ESD Tests
      1. 4.1.1 Test Method and Set-Up
      2. 4.1.2 Evaluation of Test Results
  6. 5Board Layout
  7. 6Schematics and Bill of Materials
    1. 6.1 Schematics
    2. 6.2 Bill of Materials
  8. 7Revision History

4.1.1 Test Method and Set-Up

An example test setup is shown in Figure 4-1. Details of the testing table and ground planes can be found in the IEC 61000-4-2 test procedure. Contact and air-gap discharge are tested using the same simulator with the same discharge waveform. While the simulator is in direct contact with the test point during contact, it is not during air-gap.

GUID-550419BD-1379-4388-B748-E918B32F420D-low.gifFigure 4-1 System Level ESD Test Setup