ZHCSR17 january   2023 ADS9218

ADVANCE INFORMATION  

  1. 1 特性
  2. 2 应用
  3. 3 说明
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Thermal Information
    4. 6.4  Recommended Operating Conditions
    5. 6.5  Electrical Characteristics
    6. 6.6  Timing Requirements
    7. 6.7  Switching Characteristics
    8. 6.8  Timing Diagrams
    9. 6.9  Typical Characteristics: ADS9218
    10. 6.10 Typical Characteristics: ADS9217
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Analog Inputs
      2. 7.3.2 Analog Input Bandwidth
      3. 7.3.3 ADC Transfer Function
      4. 7.3.4 Reference
        1. 7.3.4.1 Internal Reference Voltage
        2. 7.3.4.2 External Reference Voltage
      5. 7.3.5 Data Interface
        1. 7.3.5.1 Data Frame Width
        2. 7.3.5.2 Test Patterns for Data Interface
          1. 7.3.5.2.1 User-Defined Test Pattern
          2. 7.3.5.2.2 User-Defined Alternating Test Pattern
          3. 7.3.5.2.3 Ramp Test Pattern
      6. 7.3.6 ADC Sampling Clock Input
    4. 7.4 Device Functional Modes
      1. 7.4.1 Normal Operation
      2. 7.4.2 Power-Down Options
    5. 7.5 Programming
      1. 7.5.1 Register Write
      2. 7.5.2 Register Read
      3. 7.5.3 Multiple Devices: Daisy-Chain Topology for SPI Configuration
        1. 7.5.3.1 Register Write With Daisy-Chain
        2. 7.5.3.2 Register Read With Daisy-Chain
    6. 7.6 Register Map
      1. 7.6.1 Register Bank 0
      2. 7.6.2 Register Bank 1
      3. 7.6.3 Register Bank 2
  8. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Data Acquisition (DAQ) Circuit for ≤20-kHz Input Signal Bandwidth
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curves
      2. 8.2.2 Data Acquisition (DAQ) Circuit for ≤100-kHz Input Signal Bandwidth
        1. 8.2.2.1 Design Requirements
        2. 8.2.2.2 Application Curves
      3. 8.2.3 Data Acquisition (DAQ) Circuit for ≤1-MHz Input Signal Bandwidth
        1. 8.2.3.1 Design Requirements
        2. 8.2.3.2 Application Curves
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  9. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 接收文档更新通知
    3. 9.3 支持资源
    4. 9.4 Trademarks
    5. 9.5 静电放电警告
    6. 9.6 术语表
  10. 10Mechanical, Packaging, and Orderable Information
    1. 10.1 Mechanical Data

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7.3.5.2 Test Patterns for Data Interface

The ADS921x features test patterns that can be used by the host for debugging and verifying the data interface. The test patterns replace the ADC output data with predefined digital data. The test patterns can be enabled by configuring the corresponding register addresses 0x13 through 0x1B in bank 1.

The ADS921x supports the following test patterns:

  • User-defined output: User-defined, 24-bit pattern. Separate patterns for ADC A and ADC B; see the User-Defined Test Pattern section.
  • Ramp output: Digital ramp output with a user-defined increment between two steps. There are separate ramp outputs for ADC A and ADC B; see the Ramp Test Pattern section.
  • Alternate output: User-defined, 24-bit outputs that alternate between ADC A and ADC B user-defined patterns; see the User-Defined Alternating Test Pattern section.

To disable the test patterns, set TEST_PAT_EN_CHA and TEST_PAT_EN_CHB to 0b.