SBAK020 April   2025 ADC3683-SEP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the ADC3683-SEP dual 18-bit 65-MSPS ADC
  3.   Trademarks
  4. Introduction
  5. Single-Event Effects
  6. Irradiation Facility and Setup
  7. Depth, Range, and LETEFF Calculations
  8. Test Setup and Procedures
  9. Destructive Single-Event Effects (DSEE)
  10. Single-Event Transients (SET)
  11. Event Rate Calculations
  12. Summary
  13. 10References

Irradiation Facility and Setup

The heavy-ion species used for the SEE studies on this product were provided and delivered by the TAMU Cyclotron Radiation Effects Facility using a superconducting cyclotron and an advanced Electron Cyclotron Resonance (ECR) ion source. At the fluxes used, ion beams had good flux stability and high irradiation uniformity over a 1in diameter circular cross-sectional area for the in-air station. Uniformity is achieved by magnetic de-focusing. The flux of the beam is regulated over a broad range spanning several orders of magnitude. For this characterization, ion flux of 102 ions / cm2× s to 105 ions / cm2× s were used to provide heavy-ion fluences of up to 107 ions / cm2 for runs. Ion uniformity for these experiments was between 94 and 98%. See Table 7-2 for more details on the ions used and results of the runs.

Figure 3-1 shows the test board used for the experiments at the TAMU facility. Although not visible in this photo, the beam port has a 1mil Aramica window to allow in-air testing while maintaining the vacuum within the accelerator with only minor ion energy loss. A 40-mm in-air gap between the device and the ion beam port window was maintained at these distances for all runs respective to the ion that was tested.

ADC3683-SEP Photo of ADC36xx Evaluation
                    Board Mounted in Front of the Heavy-Ion Beam Exit Port at the Texas A&M
                    Cyclotron Facility Figure 3-1 Photo of ADC36xx Evaluation Board Mounted in Front of the Heavy-Ion Beam Exit Port at the Texas A&M Cyclotron Facility
ADC3683-SEP Image of ADC3683EVM Figure 3-2 Image of ADC3683EVM