SBAK020 April   2025 ADC3683-SEP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the ADC3683-SEP dual 18-bit 65-MSPS ADC
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects
  6. 3 Irradiation Facility and Setup
  7. 4 Depth, Range, and LETEFF Calculations
  8. 5 Test Setup and Procedures
  9. 6 Destructive Single-Event Effects (DSEE)
  10. 7 Single-Event Transients (SET)
  11. 8 Event Rate Calculations
  12. 9 Summary
  13. 10References

7 Single-Event Transients (SET)

Single Event Transients

SETs are defined as heavy-ion-induced transients upsets on the DCLK of the ADC3683-SEP. SET testing was performed at room temperature (no external temperature control applied). DCLK SEUs were characterized using a positive edge trigger. The devices were characterized with input voltages AVDD/IOVDD = 1.85V. To capture the event, the NI-PXI-5172 Scope Card was continuously monitoring the DCLK. The DCLK was monitored by using USER_LED3 that is located on the TSW1400EVM. The scope was attached to the LED which would go high upon seeing that the FPGA was not receiving a valid clock signal. The scope triggering from DCLK was programmed to record 20K samples with a sample rate of 5M samples per second (S/s) in case of an event (trigger). Scope was programmed to record 20% of the data before (pre) the trigger happened. Events were seen on DCLK and are characterized below. Table 7-2 lists the SET test conditions and results for all the data. The Results were analyzed and broken down into short and long events based on time taken for the DCLK to recover. A short event is defined by a transient which lasted less than 500ns while a long event lasts greater than 500ns. An example of such events can be seen in Figure 7-1 and Figure 7-2. Table 7-2 lists the SET test condition and results for all the data.
Table 7-1 Summary of ADC3683-SEP SET Test Condition and Results
Run Number Run Type Unit Number Temperature Ion Angle LETEFF (MeV × cm2/ mg) Flux (ions × cm2/ s) Fluence (ions × cm2) Count DCLK Events Count of Short Events Count of Long Events
8 SEU 1 Room 109Ag 0 51.12 1 × 102 1 × 105 1 1 0
9 SEU 1 Room 109Ag 0 51.12 1 × 104 1 × 106 6 4 2
10 SEU 1 Room 63Cu 0 21.44 1 × 102 1 × 105 3 1 2
11 SEU 1 Room 63Cu 0 21.44 1 × 104 1 × 106 5 5 0
12 SEU 1 Room 63Cu 0 21.44 1 × 105 1 × 107 50 43 7
ADC3683-SEP Example of a Short Event from Run 5 Figure 7-1 Example of a Short Event from Run 5
ADC3683-SEP Example of a Long Event from Run 5 Figure 7-2 Example of a Long Event from Run 5
ADC3683-SEP FFT Capture of Nominal Operating Conditions Figure 7-3 FFT Capture of Nominal Operating Conditions