SBAK020 April   2025 ADC3683-SEP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the ADC3683-SEP dual 18-bit 65-MSPS ADC
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects
  6. 3 Irradiation Facility and Setup
  7. 4 Depth, Range, and LETEFF Calculations
  8. 5 Test Setup and Procedures
  9. 6 Destructive Single-Event Effects (DSEE)
  10. 7 Single-Event Transients (SET)
  11. 8 Event Rate Calculations
  12. 9 Summary
  13. 10References

9 Summary

The purpose of this study was to characterize the effect of heavy-ion irradiation on the Single-Event-Effect (SEE) performance of the ADC3683-SEP. Heavy-ions with LETEFF up to 51MeV × cm2/ mg were used for the SEE test campaign. Flux of up to 105ions / cm2× s and fluences up to 107 ions / cm2 per run were used for the characterization. The SEE results demonstrated that the ADC3683-SEP is SEL and SEFI free up to LETEFF = 51MeV × cm2/ mg. The device is characterized for SETs up to LETEFF = 51MeV × cm2/ mg. CREME96-based worst-week event-rate calculations for LEO (ISS) and GEO orbits are presented for reference.