SBAK020 April   2025 ADC3683-SEP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the ADC3683-SEP dual 18-bit 65-MSPS ADC
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects
  6. 3 Irradiation Facility and Setup
  7. 4 Depth, Range, and LETEFF Calculations
  8. 5 Test Setup and Procedures
  9. 6 Destructive Single-Event Effects (DSEE)
  10. 7 Single-Event Transients (SET)
  11. 8 Event Rate Calculations
  12. 9 Summary
  13. 10References

Abstract

The purpose of this study is to characterize the single-event effects (SEE) performance due to heavy-ion irradiation of the ADC3683-SEP. Heavy-ions with LETEFF (Effective Linear Energy Transfer) of up to 51MeV × cm2/ mg were used to irradiate the device. Tests were run across a range of flux and fluences for the characterization. Flux was between 102 ions / (cm2× s) and 105 ions / (cm2× s) and fluence between 105 ions / cm2 and 107 ions / cm2 per run. The results demonstrated that the ADC3683-SEP is single event latch-up free at T = 125°C. Single event upsets are characterized at 25°C and no functional interrupts (power-cycle events) were seen up to 51MeV × cm2/ mg. See Section 7 for more details.