SBAK020 April   2025 ADC3683-SEP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the ADC3683-SEP dual 18-bit 65-MSPS ADC
  3.   Trademarks
  4. Introduction
  5. Single-Event Effects
  6. Irradiation Facility and Setup
  7. Depth, Range, and LETEFF Calculations
  8. Test Setup and Procedures
  9. Destructive Single-Event Effects (DSEE)
  10. Single-Event Transients (SET)
  11. Event Rate Calculations
  12. Summary
  13. 10References

Trademarks

National Instruments™ and LabVIEW™ are trademarks of National Instruments.

HP-Z4® is a registered trademark of HP Development Company, L.P..

All trademarks are the property of their respective owners.