ZHCSUF1 January   2024 TPS7H3014-SP

ADVANCE INFORMATION  

  1.   1
  2. 1 特性
  3. 2 应用
  4. 3 说明
  5. 4 Device Options
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements
    7. 6.7 Quality Conformance Inspection
    8. 6.8 Typical Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Input Voltage (IN), VLDO and REFCAP
        1. 7.3.1.1 Undervoltage Lockout (VPOR_IN < VIN < UVLO)
        2. 7.3.1.2 Power-On Reset (VIN < VPOR_IN )
      2. 7.3.2 SENSEx Inputs
        1. 7.3.2.1 VTH_SENSEX and VONx
        2. 7.3.2.2 IHYS_SENSEx and VOFFx
        3. 7.3.2.3 Top and Bottom Resistive Divider Design Equations
      3. 7.3.3 Output Stages (ENx,SEQ_DONE,PWRGD,PULL_UP1 and PULL_UP2)
      4. 7.3.4 User-Programmable TIMERS
        1. 7.3.4.1 DLY_TMR
        2. 7.3.4.2 REG_TMR
      5. 7.3.5 UP and DOWN
      6. 7.3.6 FAULT
      7. 7.3.7 State Machine
    4. 7.4 Daisy Chain
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Self Contained – Sequence UP and DOWN
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
          1. 8.2.1.2.1 Input Power Supplies and Decoupling Capacitors
          2. 8.2.1.2.2 UP and DOWN Thresholds
          3. 8.2.1.2.3 SENSEx Thresholds
        3. 8.2.1.3 Application Curves
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 接收文档更新通知
    3. 9.3 支持资源
    4. 9.4 Trademarks
    5. 9.5 静电放电警告
    6. 9.6 术语表
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

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6.7 Quality Conformance Inspection

MIL-STD-883, Method 5005 - Group A

SUBGROUP DESCRIPTION TEMP (°C)
1 Static tests at 25
2 Static tests at 125
3 Static tests at –55
4 Dynamic tests at 25
5 Dynamic tests at 125
6 Dynamic tests at –55
7 Functional tests at 25
8A Functional tests at 125
8B Functional tests at –55
9 Switching tests at 25
10 Switching tests at 125
11 Switching tests at –55