ZHCSS95B march   2022  – may 2023 TPS389006-Q1

PRODUCTION DATA  

  1.   1
  2. 1 特性
  3. 2 应用
  4. 3 说明
  5. 4 Revision History
  6. 5 Device Comparison
  7. 6 Pin Configuration and Functions
  8. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements
    7. 7.7 Typical Characteristics
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 I2C
      2. 8.3.2 Auto Mask (AMSK)
      3. 8.3.3 PEC
      4. 8.3.4 VDD
      5. 8.3.5 MON
      6. 8.3.6 NIRQ
      7. 8.3.7 ADC
      8. 8.3.8 Time Stamp
    4. 8.4 Device Functional Modes
      1. 8.4.1 Built-In Self Test and Configuration Load
        1. 8.4.1.1 Notes on BIST Execution
      2. 8.4.2 TPS389006-Q1 Power ON
      3. 8.4.3 General Monitoring
        1. 8.4.3.1 IDLE Monitoring
        2. 8.4.3.2 ACTIVE Monitoring
        3. 8.4.3.3 Sequence Monitoring 1
          1. 8.4.3.3.1 ACT Transitions 0→1
          2. 8.4.3.3.2 SLEEP Transition 1→0
          3. 8.4.3.3.3 SLEEP Transition 0→1
        4. 8.4.3.4 Sequence Monitoring 2
          1. 8.4.3.4.1 ACT Transition 1→0
    5. 8.5 Register Maps
      1. 8.5.1 BANK0 Registers
      2. 8.5.2 BANK1 Registers
  10. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Automotive Multichannel Sequencer and Monitor
      2. 9.2.2 Design Requirements
      3. 9.2.3 Detailed Design Procedure
      4. 9.2.4 Application Curves
  11. 10Power Supply Recommendations
    1. 10.1 Power Supply Guidelines
  12. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  13. 12Device and Documentation Support
    1. 12.1 Device Nomenclature
    2. 12.2 Documentation Support
    3. 12.3 接收文档更新通知
    4. 12.4 支持资源
    5. 12.5 Trademarks
    6. 12.6 静电放电警告
    7. 12.7 术语表
  14. 13Mechanical, Packaging, and Orderable Information

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8.4.1 Built-In Self Test and Configuration Load

Built-In Self Test (BIST) is performed:

  1. At Power On Reset (POR), if TEST_CFG.AT_POR=1
  2. When exiting ACTIVE state due to ACT transitioning from 1→0, if TEST_CFG.AT_SHDN=1

Configuration load from OTP is assisted by ECC (supporting SEC-DED). This is to protect against data integrity issues and to maximize system availability.

During BIST, NIRQ is de-asserted (asserted in case of failure), input pins are ignored, SYNC is tri-stated, and the I2C block is inactive with SDA and SCL de-asserted. The BIST includes device testing to meet the Functional Safety goals outlined in functional safety documentation. Once BIST is completed without failure, I2C is immediately active and the device enters the IDLE sate after loading the configuration data from OTP. If BIST fails and/or ECC reports Double-Error Detection (DED; meant for detecting multiple bit flips when loading data from memory), NIRQ is asserted, the device enters FAILSAFE state, and a best effort attempt is made to keep the I2C function active. TEST_INFO register may provide additional information on the test results.

The detailed behavior upon success/failure of the BIST is controlled by INT_TEST and IEN_TEST registers. Reporting of the BIST results is carried out through:

  • NIRQ pin: pulled low depending on the test result and BIST_C and BIST bits in IEN_TEST
  • I_BIST_C and BIST bits in INT_TEST register depending on IEN_TEST settings
  • VMON_STAT.ST_BIST_C register bit
  • TEST_INFO[3:0] register bits