SPRUJD3A July 2025 – October 2025 F28E120SB , F28E120SC
A mechanism has been added to enable self-testing of the ECC logic for additional diagnostic coverage. To use this mechanism, configure the ECC_TEST_EN field in the FECC_CTRL register. A value of 01 in ECC_TEST_EN injects a single-bit error into the redundant ECC logic upon a Flash read access, and a value of 11 injects a double-bit error upon a Flash read access. This causes an output comparison failure. In this mode, the diagnostic outputs of each of the high and low comparators (DIAG_H and DIAG_L) are captured in the FLUCERRSTATUS Memconfig register.