SLVSHK4 December 2025 MCT8376Z-Q1
PRODUCTION DATA
The SO pin on the MCT8376Z-Q1 outputs an analog voltage proportional to current flowing in the low side FETs multiplied by the gain setting (GCSA). The gain setting is adjustable between four different levels which can be set by the GAIN pin (in hardware device variant) or the GAIN bits (in SPI device variant).
Figure 7-22 shows the internal architecture of the current sense amplifiers. The current sense is implemented with the sense FET on each low-side FET of the MCT8376Z-Q1 device. This current information is fed to the internal I/V converter, which generates the CSA output voltage on the SO pin based on the AVDD voltage and the Gain setting. The CSA output voltage can be calculated as :
The GAIN of the CSA can be adjusted by the GAIN_SLEW_tLOCK pin as per Table 7-6 in hardware device variant or by using the SLEW bits in SPI device variant. Each half-bridge can be selected to either of a slew rate setting of 1V/ns, 0.5V/ns, 0.25V/ns or 0.05V/ns in SPI device. Each half-bridge can be selected to either of a slew rate setting of 1.1V/ns or 0.25V/ns in hardware device. The slew rate is calculated by the rise time and fall time of the voltage on OUTx pin as shown in Figure 7-13.
Configuration | GAIN_SLEW_tLOCK Pin (Hardware Variant) | GAIN | SLEW | LOCK_DET_TIME |
|---|---|---|---|---|
| 1 | Connected to AGND | 0.4V/A | 1.1V/ns | 500ms |
| 2 | Connected to AGND with RMODE1 | 0.4V/A | 1.1V/ns | 5000ms |
| 3 | Connected to AGND with RMODE2 | 0.4V/A | 0.25V/ns | 500ms |
| 4 | Hi-Z | 0.4V/A | 0.25V/ns | 5000ms |
| 5 | Connected to GVDD with RMODE2 | 2.5V/A | 1.1V/ns | 500ms |
| 6 | Connected to GVDD with RMODE1 | 2.5V/A | 1.1V/ns | 5000ms |
| 7 | Connected to GVDD | 2.5V/A | 0.25V/ns | 500ms |