ZHCSQT2 March   2024 ADS127L18

ADVANCE INFORMATION  

  1.   1
  2. 1 特性
  3. 2 应用
  4. 3 说明
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Timing Requirements
    7. 5.7 Switching Characteristics
    8. 5.8 Timing Diagrams
  7. 6 Parameter Measurement Information
    1. 6.1  Offset Error Measurement
    2. 6.2  Offset Drift Measurement
    3. 6.3  Gain Error Measurement
    4. 6.4  Gain Drift Measurement
    5. 6.5  NMRR Measurement
    6. 6.6  CMRR Measurement
    7. 6.7  PSRR Measurement
    8. 6.8  SNR Measurement
    9. 6.9  INL Error Measurement
    10. 6.10 THD Measurement
    11. 6.11 IMD Measurement
    12. 6.12 SFDR Measurement
    13. 6.13 Noise Performance
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Analog Inputs (AINP, AINN)
        1. 7.3.1.1 Input Range
      2. 7.3.2 Reference Voltage (REFP, REFN)
        1. 7.3.2.1 Reference Voltage Range
      3. 7.3.3 Clock Operation
        1. 7.3.3.1 Internal Oscillator
        2. 7.3.3.2 External Clock
      4. 7.3.4 Power Supplies
        1. 7.3.4.1 AVDD1 and AVSS
        2. 7.3.4.2 AVDD2
        3. 7.3.4.3 IOVDD
        4. 7.3.4.4 Power-On Reset (POR)
        5. 7.3.4.5 CAPA and CAPD
      5. 7.3.5 VCM Output Voltage
      6. 7.3.6 GPIO
      7. 7.3.7 Modulator
      8. 7.3.8 Digital Filter
        1. 7.3.8.1 Wideband Filter
      9. 7.3.9 Low-Latency Filter (Sinc)
        1. 7.3.9.1 Sinc4 Filter
        2. 7.3.9.2 Sinc4 + Sinc1 Cascade Filter
        3. 7.3.9.3 Sinc3 Filter
        4. 7.3.9.4 Sinc3 + Sinc1 Filter
    4. 7.4 Device Functional Modes
      1. 7.4.1  Speed Modes
      2. 7.4.2  Synchronization
        1. 7.4.2.1 Synchronized Control Mode
        2. 7.4.2.2 Start/Stop Control Mode
      3. 7.4.3  Digital Filter Settling
      4. 7.4.4  Conversion-Start Delay Time
      5. 7.4.5  Data Averaging
      6. 7.4.6  Calibration
        1. 7.4.6.1 Offset Calibration Registers
        2. 7.4.6.2 Gain Calibration Registers
        3. 7.4.6.3 Calibration Procedure
      7. 7.4.7  Reset
        1. 7.4.7.1 RESET Pin
        2. 7.4.7.2 Reset by SPI Register
        3. 7.4.7.3 Reset by SPI Input Pattern
      8. 7.4.8  Power-Down
      9. 7.4.9  Idle and Standby Modes
      10. 7.4.10 Diagnostics
        1. 7.4.10.1 ERROR Pin and ERR_FLAG Bit
        2. 7.4.10.2 Clock Counter
        3. 7.4.10.3 SCLK Counter
        4. 7.4.10.4 Frame-Sync CRC
        5. 7.4.10.5 SPI CRC
        6. 7.4.10.6 Register Map CRC
        7. 7.4.10.7 Self Test
      11. 7.4.11 Frame-Sync Data Port
        1. 7.4.11.1 FSYNC Pin
        2. 7.4.11.2 DCLK Pin
        3. 7.4.11.3 DOUTn Pins
        4. 7.4.11.4 DINn Pins
        5. 7.4.11.5 Time Division Multiplexing (TDM)
        6. 7.4.11.6 Data Size
        7. 7.4.11.7 STATUS_DP Header
        8. 7.4.11.8 Daisy Chain
        9. 7.4.11.9 Data Port Offset Timing
    5. 7.5 Programming
      1. 7.5.1 Hardware Programming
      2. 7.5.2 SPI Programming
        1. 7.5.2.1 Chip Select (CS)
        2. 7.5.2.2 Serial Clock (SCLK)
        3. 7.5.2.3 Serial Data Input (SDI)
        4. 7.5.2.4 Serial Data Output (SDO)
      3. 7.5.3 SPI Frame
      4. 7.5.4 SPI Commands
        1. 7.5.4.1 Read Register Command
        2. 7.5.4.2 Write Register Command
      5. 7.5.5 SPI Daisy-Chain
  9. 8 Register Map
  10. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Input Driver
      2. 9.1.2 Antialias Filter
      3. 9.1.3 Reference Voltage
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curves
    3. 9.3 Power Supply Recommendations
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Documentation Support
      1. 10.1.1 Related Documentation
    2. 10.2 接收文档更新通知
    3. 10.3 支持资源
    4. 10.4 Trademarks
    5. 10.5 静电放电警告
    6. 10.6 术语表
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information
    1. 12.1 Mechanical Data

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6.9 INL Error Measurement

Integral nonlinearity (INL) error specifies the linearity of the ADC dc transfer function. INL is measured by applying a series of dc test voltages along a straight line computed from the slope and offset transfer function of the ADC. INL is the difference between a set of dc test voltages [VIN(N)] to the corresponding set of output voltages [VOUT(N)]. Equation 12 shows the end-point method of calculating INL error.

Equation 9. INL (ppm of FSR) = Maximum absolute value of INL test series [106 · (VIN(N) – VOUT(N)) / FSR]

where:

  • N = Index of dc test voltage
  • [VIN(N)] = Set of test voltages over the FSR range of –95% to 95%
  • [VOUT(N)] = Set of corresponding ADC output voltages
  • FSR (full-scale range) = 2 · VREF (1x input range) or 4 · VREF (2x input range)

The INL best-fit method uses a least-squared error (LSE) calculation to determine a new straight line. This line minimizes the root-sum-square of the INL errors above and below the original end-point line.