SWCU194 March 2023 CC1314R10 , CC1354P10 , CC1354R10 , CC2674P10 , CC2674R10
The AON IOC supports detection of positive and (or) negative edges on the digital I/Os and provides the resulting events to the AON event fabric as the following events:
IOEV_AON_PROG0
IOEV_AON_PROG1
IOEV_AON_PROG2
IOEV_RTC
IOEV_MCU_WU
The edge-detect event can be cleared by both the MCU GPIO and the AUX Domain. The edge detect event can also be cleared from MCU IOC by doing a disable or enable cycle of the edge configuration. The MCU GPIO has a separate clear line to each edge detection cell, while the AUX Domain uses a single line to clear all events on pins connected to the AUX Domain. When clearing from AUX Domain, all events related to AUX Domain I/Os are cleared.
The edge detect block uses an edge-detect cell for each I/O. Each detection cell can flag edge-detected and trigger an interrupt signal. The interrupt signals from all cells are ORed together to form a single interrupt line toward the AON event fabric.
The AON IOC can also generate an interrupt event when any programmable subset of the input I/Os generates an event. The registers controlling the edge-detect circuit reside in the MCU IOC.