SLVAEF4C august   2019  – may 2023 TPS7H4001-SP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the TPS7H4001-SP
  3.   Trademarks
  4. Introduction
  5. Single-Events Effects (SEE)
  6. Test Device and Evaluation Board Information
  7. Irradiation Facility and Setup
  8. Depth, Range, and LETEFF Calculation
  9. Test Setup and Procedures
  10. Destructive Single-Event Effects (DSEE)
    1. 7.1 Safe-Operating-Area (SOA) Results
    2. 7.2 Single Event Latch-Up (SEL) Results
    3. 7.3 Single-Event-Burnout (SEB) and Single-Event-Gate-Rupture (SEGR) Results
  11. Single-Event Transients (SET)
  12. Summary
  13. 10Total Ionizing Dose (TID) From SEE Experiments
  14. 11References
  15. 12Revision History

Introduction

The TPS7H4001-SP is a space-grade, radiation hardened, 7-V, 18-A, synchronous buck, point-of-load (POL) converter, which has been optimized for small designs with high-efficiency operation and integration of the high-side and low-side power MOSFETs into a compact monolithic design. Further space saving is achieved through the use of the configurable switching frequency (0.1 MHz to 1 MHz), which can reduce the output filter lumped components and optimizing the power density (W/in3). The device is offered in a thermally enhanced 34-pin ceramic, dual inline flat-pack package. General device information and test conditions are listed in Table 1-1. For more detailed technical specifications, user guides, and application notes, see the TPS7H4001-SP product page.

Table 1-1 Overview Information
DESCRIPTION(1)DEVICE INFORMATION
TI Part NumberTPS7H4001-SP
Orderable Name5962-1820501VXC
Device FunctionPoint-of-load (POL) switching regulator
Technology250-nm linear BiCMOS
Exposure FacilityRadiation Effects Facility, Cyclotron Institute, Texas A&M University (15 MeV/nucleon)
Irradiation Temperature25°C and 125°C (for SEL testing)
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