SLVAEF4C august   2019  – may 2023 TPS7H4001-SP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the TPS7H4001-SP
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Events Effects (SEE)
  6. 3 Test Device and Evaluation Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Safe-Operating-Area (SOA) Results
    2. 7.2 Single Event Latch-Up (SEL) Results
    3. 7.3 Single-Event-Burnout (SEB) and Single-Event-Gate-Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Summary
  13. 10Total Ionizing Dose (TID) From SEE Experiments
  14. 11References
  15. 12Revision History

12 Revision History

Changes from Revision A (November 2020) to Revision B (December 2021)

  • Updated the numbering format for tables, figures, and cross-references throughout the documentGo
  • Changed content to fix typos and account for offset in the original data throughout the documentGo
  • Replaced board photo with higher resolution imageGo

Changes from Revision B (December 2021) to Revision C (May 2023)

  • Added text to Abstract Go
  • Added Photograph of the Delidded TPS7H4001-SP (SHP) [Left] and a Pin-Out Diagram [Right] Go