SLVAEF4C august   2019  – may 2023 TPS7H4001-SP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the TPS7H4001-SP
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Events Effects (SEE)
  6. 3 Test Device and Evaluation Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Safe-Operating-Area (SOA) Results
    2. 7.2 Single Event Latch-Up (SEL) Results
    3. 7.3 Single-Event-Burnout (SEB) and Single-Event-Gate-Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Summary
  13. 10Total Ionizing Dose (TID) From SEE Experiments
  14. 11References
  15. 12Revision History

10 Total Ionizing Dose (TID) From SEE Experiments

The production TPS7H4001-SP POL is rated to a total ionizing dose (TID) of 100 krad(Si). In the course of the SEE testing, the heavy-ion exposures delivered ≈10 krad(Si) per 107 ions/cm2 run. The cumulative TID exposure, for each device respectively, was always controlled to be less than 100 krad(Si). With the exception of the 17 units that were deliberately operated outside the SOA in an effort to capture the onset of DSEE, all 20/37 production RHA TPS7H4001-SP devices used in the studies described in this report stayed within specification and were fully-functional after the heavy-ion SEE testing was completed.