High-performance analog blocks are integrated on the F29H859TU-Q1 MCU to further enable system consolidation. Three separate 12-bit SAR ADCs and Two separate 16-bit/12-bit selectable SAR ADCs provide precise and efficient management of multiple analog signals, which ultimately boosts system throughput. Four analog comparator modules provide continuous monitoring of input voltage levels for trip conditions. The main supported safety mechanisms for ADC are as follows.
- DAC to ADC Loopback Check. Integrity of ADC can
be checked by monitoring the DAC output using ADC. A set of predetermined
voltage levels can be configured and output by DAC. These voltage levels can be
measured by the ADC and cross checked against the expected value to verify the
ADC are functioning properly.
- ADC Input Signal Integrity Check. ADC input
signal integrity can be checked using a mix of hardware and software runtime
diagnostic on ADC conversions. A plausibility check of the input signal can be
checked with the help of built-in hardware mechanisms and software configurable
thresholds. The plausibility check of converted results can be checked by using
an ADC post processing block.
- Hardware Redundancy with ADC Safety Checker.
Using multiple instances of the ADC to sample the same input and simultaneously
perform the same operation followed by cross check of the output values. The
hardware-based result safety checker module that automatically compares the
results from primary and redundant ADCs once both the results are
available.
- Software Test of Function Including Error Tests.
Support run functionality test or fault injection test on the ADC module and
post processing block. A set of predetermined voltage levels can be provided on
the ADC input pin by external circuit or internal DAC. The conversion result can
be compared with expected value to check the functional correctness of ADC
module and post processing block.
- Logic Power on Self-Test. LPOST (Logic Power on
Self-Test) provides high diagnostic coverage for the device at a transistor
level during start-up and application time. LPOST utilizes Design for Test (DFT)
structures inserted into the device for rapid execution of high-quality
manufacturing tests, but with an internal test engine rather than external
automated test equipment (ATE). The LPOST test is triggered by the BootROM based
on the SECCFG user input.