ZHCSNY3Q September 2002 – June 2025 TPS796
PRODUCTION DATA
| 参数 | 测试条件 | 最小值 | 典型值 | 最大值 | 单位 | ||
|---|---|---|---|---|---|---|---|
| VIN | 输入电压 | 旧芯片 | 2.7 | 5.5 | V | ||
| 新芯片 | 2.7 | 6.0 | |||||
| VFB | 内部基准 (TPS79601) | 1.2 | 1.225 | 1.25 | V | ||
| IOUT | 持续输出电流 | 0 | 1 | A | |||
| VOUT | 输出电压范围 (TPS79601) | 1.225 | 5.5VDO | V | |||
| VOUT | 输出精度 | TPS79601 | 0µA ≤ IOUT ≤ 1A, VOUT(nom) + 1V ≤ VIN ≤ 5.5V (1) |
0.98VOUT(nom) | 1.02VOUT(nom) | % | |
| VOUT | 输出精度 | 固定值 VOUT < 5V | 0µA ≤ IOUT ≤ 1A, VOUT(nom) + 1V ≤ VIN ≤ 5.5V (1) |
-2.0 | 2.0 | % | |
| VOUT | 输出精度 | 固定值 VOUT = 5V | 0µA ≤ IOUT ≤ 1A, VOUT(nom) + 1V ≤ VIN ≤ 5.5V (1) |
-3.0 | 3.0 | % | |
| ΔVOUT/ΔVIN | 线路调整 | VOUT + 1V ≤ VIN ≤ 5.5V | 0.05 | 0.12 | %/V | ||
| ΔVOUT/ΔIOUT | 负载调整率 | 0 µA ≤ IOUT ≤ 1 A | 5 | mV | |||
| VDO | 压降电压 TPS79628 | VIN= VOUT - 0.1V | IOUT = 1A | 270 | 365 | mV | |
| 压降电压 TPS79628DRB | IOUT = 250mA | 52 | 90 | ||||
| 压降电压 TPS79630 | IOUT = 1A | 250 | 345 | ||||
| 压降电压 TPS79633 | IOUT = 1A | 220 | 325 | ||||
| 压降电压 TPS79650 | IOUT = 1A | 220 | 300 | ||||
| ICL | 输出电流限制 | VOUT = 0(旧芯片) | 2.4 | 4.2 | A | ||
| ICL | 输出电流限制 | VIN = VOUT(nom) + 1.25V 或 2.0V(以较大者为准),VOUT = 0.9 x VOUT(nom) (仅限新芯片)(2) | 1.04 | 1.65 | A | ||
| ISC | 短路电流限制 | VOUT = 0(仅限新芯片) | 550 | mA | |||
| IGND | 接地电流 | 0µA ≤ IOUT ≤ 1A(旧芯片) | 265 | 385 | µA | ||
| IGND | 接地电流 | 0µA ≤ IOUT ≤ 1A (新芯片) | 700 | 1100 | µA | ||
| ISHDN | 关断电流 | VEN = 0V,2.7 V ≤ VIN ≤ 5.5V | 0.07 | 1 | µA | ||
| IFB | 反馈引脚电流 | VFB = 1.225V | 1 | µA | |||
| PSRR | 电源抑制比 | f = 100Hz,IOUT = 10mA(旧芯片) | 59 | dB | |||
| f = 100Hz,IOUT = 10mA(新芯片) | 64 | ||||||
| f = 100Hz,IOUT = 1A(旧芯片) | 54 | ||||||
| f = 100Hz,IOUT = 1A(新芯片) | 74 | ||||||
| f = 10kHz,IOUT = 1A(旧芯片) | 53 | ||||||
| f = 10kHz,IOUT = 1A(新芯片) | 49 | ||||||
| f = 100kHz,IOUT = 1A(旧芯片) | 42 | ||||||
| f = 100kHz,IOUT = 1A(新芯片) | 42 | ||||||
| Vn | 输出噪声电压 | BW = 100Hz 至 100kHz,IOUT = 1A | CNR = 0.001µF | 54 | µVRMS | ||
| CNR = 0.0047µF | 46 | ||||||
| CNR = 0.01µF | 41 | ||||||
| CNR = 0.1µF | 40 | ||||||
| BW = 10Hz 至 100kHz,IOUT = 1A | 新芯片 (10 | 78 | µVRMS | ||||
| tstr | 启动时间 | RL = 3Ω,COUT = 1µF | CNR = 0.001µF | 50 | µs | ||
| RL = 3Ω,COUT = 1µF | CNR = 0.0047µF | 75 | |||||
| RL = 3Ω,COUT = 1µF | CNR = 0.01µF | 110 | |||||
| tstr | 启动时间 | RL = 3Ω,COUT = 1µF | 新芯片 | 550 | µs | ||
| IEN | 使能引脚电流 | VEN = 0V | -1 | 1 | µA | ||
| RPULLDOWN | 下拉电阻 | VIN = 3.3V(仅限新芯片) | 100 | Ω | |||
| VUVLO | UVLO 阈值 | VIN 上升(旧芯片) | 2.25 | 2.65 | V | ||
| VIN 上升(新芯片) | 1.28 | 1.62 | |||||
| VUVLO(HYST) | UVLO 迟滞 | VIN 迟滞(旧芯片) | 100 | mV | |||
| VIN 迟滞(新芯片) | 130 | ||||||
| VEN(HI) | 高电平使能输入电压 | 2.7V(1) ≤ VIN ≤ 5.5V(旧芯片) | 1.7 | VIN | V | ||
| 2.7V(1) ≤ VIN ≤ 5.5V(新芯片) | 0.85 | VIN | |||||
| VEN(LOW) | 低电平使能输入电压 | 2.7V(1) ≤ VIN ≤ 5.5V(旧芯片) | 0.7 | ||||
| 2.7V(1) ≤ VIN ≤ 5.5V(新芯片) | 0.425 | ||||||
| TSD | 热关断温度 | 关断,温度升高 | 旧芯片 | 165 | ℃ | ||
| TSD | 热关断温度 | 关断,温度升高 | 新芯片 | 170 | ℃ |
||
| TSD | 热关断温度 | 复位,温度降低 | 旧芯片 | 140 | ℃ |
||
| TSD | 热关断温度 | 复位,温度降低 | 新芯片 | 155 | ℃ |
||