ZHCSJ44D December   2018  – April 2022 INA819

PRODUCTION DATA  

  1. 1 特性
  2. 2 应用
  3. 3 说明
  4. 4 Revision History
  5. 5 Device Comparison Table
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Setting the Gain
        1. 8.3.1.1 Gain Drift
      2. 8.3.2 EMI Rejection
      3. 8.3.3 Input Common-Mode Range
      4. 8.3.4 Input Protection
      5. 8.3.5 Operating Voltage
      6. 8.3.6 Error Sources
    4. 8.4 Device Functional Modes
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Reference Pin
      2. 9.1.2 Input Bias Current Return Path
    2. 9.2 Typical Applications
      1. 9.2.1 Three-Pin Programmable Logic Controller (PLC)
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
        3. 9.2.1.3 Application Curves
      2. 9.2.2 Resistance Temperature Detector Interface
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Development Support
        1. 12.1.1.1 PSpice® for TI
        2. 12.1.1.2 TINA-TI™ Simulation Software (Free Download)
    2. 12.2 Documentation Support
      1. 12.2.1 Related Documentation
    3. 12.3 接收文档更新通知
    4. 12.4 支持资源
    5. 12.5 Trademarks
    6. 12.6 Electrostatic Discharge Caution
    7. 12.7 术语表
  13. 13Mechanical, Packaging, and Orderable Information

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

8.3.6 Error Sources

Most modern signal-conditioning systems calibrate errors at room temperature. However, calibration of errors that result from a change in temperature is normally difficult and costly. Therefore, minimize these errors by choosing high-precision components, such as the INA819, that have improved specifications in critical areas that impact the precision of the overall system. Figure 8-10 shows an example application.

GUID-774EB634-FA9F-45A7-B101-B15C5C1B9300-low.gif Figure 8-10 Example Application with G = 10 V/V and 1-V Output Voltage

Resistor-adjustable devices (such as the INA819) show the lowest gain error in G = 1 because of the inherently well-matched drift of the internal resistors of the differential amplifier. At gains greater than 1 (for instance, G = 10 V/V or G = 100 V/V), the gain error becomes a significant error source because of the contribution of the resistor drift of the 25-kΩ feedback resistors in conjunction with the external gain resistor. Except for very high gain applications, the gain drift is by far the largest error contributor compared to other drift errors, such as offset drift.

The INA819 offers excellent gain error over temperature for both G > 1 and G = 1 (no external gain resistor). Table 8-4 summarizes the major error sources in common INA applications and compares the three cases of G = 1 (no external resistor) and G = 10 (5.49-kΩ external resistor) and G = 100 (511-Ω external resistor). All calculations are assuming an output voltage of VOUT = 1 V. Thus, the input signal VDIFF (given by VDIFF= VOUT/G) exhibits smaller and smaller amplitudes with increasing gain G. In this example, VDIFF = 1 mV at G = 1000. All calculations refer the error to the input for easy comparison and system evaluation. As Table 8-4 shows, errors generated by the input stage (such as input offset voltage) are more dominant at higher gain, while the effects of output stage are suppressed because they are divided by the gain when referring them back to the input. The gain error and gain drift error are much more significant for gains greater than 1 because of the contribution of the resistor drift of the 25-kΩ feedback resistors in conjunction with the external gain resistor. In most applications, static errors (absolute accuracy errors) can readily be removed during calibration in production, while the drift errors are the key factors limiting overall system performance.

Table 8-3 System Specifications for Error Calculation
QUANTITYVALUEUNIT
VOUT1V
VCM10V
VS1V
RS+1000Ω
RS–999Ω
RG tolerance0.01%
RG drift10ppm/°C
Temperature range upper limit105°C
Table 8-4 Error Calculation
ERROR SOURCE ERROR CALCULATION INA819 VALUES
SPECIFICATION UNIT G = 1 ERROR (ppm) G = 100 ERROR (ppm) G = 1000 ERROR (ppm)
ABSOLUTE ACCURACY AT 25°C
Input offset voltage VOSI / VDIFF 35 µV 35 350 3500
Output offset voltage VOSO / (G × VDIFF) 300 µV 300 300 300
Input offset current IOS × maximum (RS+, RS–) / VDIFF 0.5 nA 1 5 50
CMRR (min) VCM / (10CMRR/20 × VDIFF) 90 (G = 1),
110 (G = 10),
130 (G = 100)		 dB 316 316 316
PSRR (min) (VCC – VS)/ (10PSRR/20 × VDIFF) 110 (G = 1),
114 (G = 10),
130 (G = 100)		 dB 3 20 32
Gain error from INA (max) GE(%) × 104 0.02 (G = 1),
0.15 (G = 10, 100)		 % 200 1500 1500
Gain error from external resistor RG (max) GE(%) × 104 0.01 % 100 100 100
Total absolute accuracy error (ppm) at 25°C, worst case sum of all errors — — 955 2591 5798
Total absolute accuracy error (ppm) at 25°C, average rms sum of all errors — — 491 1604 3835
DRIFT TO 105°C
Gain drift from INA (max) GTC × (TA – 25) 5 (G = 1),
35 (G = 10, 100)		 ppm/°C 400 2800 2800
Gain drift from external resistor RG (max) GTC × (TA – 25) 10 ppm/°C 800 800 800
Input offset voltage drift (max) (VOSI_TC / VDIFF) × (TA – 25) 0.4 µV/°C 32 320 3200
Output offset voltage drift [VOSO_TC / ( G × VDIFF)] × (TA – 25) 5 µV/°C 400 400 400
Offset current drift IOS_TC × maximum (RS+, RS–) ×
(TA – 25) / VDIFF		 20 pA/°C 2 16 160
Total drift error to 105°C (ppm), worst case sum of all errors — — 1634 4336 7360
Total drift error to 105°C (ppm), typical rms sum of all errors — — 980 2957 4348
RESOLUTION
Gain nonlinearity 10 (G = 1, 10),
15 (G = 100)		 ppm of FS 10 10 15
Voltage noise (at 1 kHz) GUID-BCAC9A0B-6638-4DC8-A61F-75E98C5DD946-low.gif eNI = 8,
eNO = 90		 µVPP 1204 1070 3941
Current noise (at 1kHz) IN × maximum (RS+, RS–) × √BW / VDIFF 0.13 pA/√ Hz 0.3 2 11
Total resolution error (ppm), worst case sum of all errors — — 1214 1080 3956
Total resolution error (ppm), typical rms sum of all errors — — 1204 1070 3941
TOTAL ERROR
Total error (ppm), worst case sum of all errors — — 3802 8007 17113
Total error (ppm), typical rms sum of all errors — — 1628 3530 7010