ZHCSDE7A
February 2015 – March 2021
INA225-Q1
PRODUCTION DATA
1
特性
2
应用
3
说明
4
Revision History
5
Pin Configuration and Functions
6
Specifications
6.1
Absolute Maximum Ratings (1)
6.2
ESD Ratings
6.3
Recommended Operating Conditions
6.4
Thermal Information
6.5
Electrical Characteristics
6.6
Typical Characteristics
7
Detailed Description
7.1
Overview
7.2
Functional Block Diagram
7.3
Feature Description
7.3.1
Selecting A Shunt Resistor
7.3.1.1
Selecting A Current-Sense Resistor Example
7.3.1.2
Optimizing Power Dissipation versus Measurement Accuracy
7.3.2
Programmable Gain Select
7.4
Device Functional Modes
7.4.1
Input Filtering
7.4.2
Shutting Down the Device
7.4.3
Using the Device with Common-Mode Transients Above 36 V
8
Applications and Implementation
8.1
Application Information
8.2
Typical Applications
8.2.1
Microcontroller-Configured Gain Selection
8.2.1.1
Design Requirements
8.2.1.2
Detailed Design Procedure
8.2.1.3
Application Curve
8.2.2
Unidirectional Operation
8.2.2.1
Design Requirements
8.2.2.2
Detailed Design Procedure
8.2.2.3
Application Curve
8.2.3
Bidirectional Operation
8.2.3.1
Design Requirements
8.2.3.2
Detailed Design Procedure
8.2.3.3
Application Curve
9
Power Supply Recommendations
10
Layout
10.1
Layout Guidelines
10.2
Layout Example
11
Device and Documentation Support
11.1
Documentation Support
11.1.1
Related Documentation
11.2
接收文档更新通知
11.3
支持资源
11.4
Trademarks
11.5
静电放电警告
11.6
术语表
12
Mechanical, Packaging, and Orderable Information
封装选项
机械数据 (封装 | 引脚)
DGK|8
MPDS028E
散热焊盘机械数据 (封装 | 引脚)
订购信息
zhcsde7a_oa
zhcsde7a_pm
11.5
静电放电警告
静电放电 (ESD) 会损坏这个集成电路。德州仪器 (TI) 建议通过适当的预防措施处理所有集成电路。如果不遵守正确的处理和安装程序,可能会损坏集成电路。
ESD 的损坏小至导致微小的性能降级,大至整个器件故障。精密的集成电路可能更容易受到损坏,这是因为非常细微的参数更改都可能会导致器件与其发布的规格不相符。