SLVK327A July 2026 – October 2026 TPS7H1301-SP , TPS7H1302-SP
- 1
- 2
- Trademarks
- 1 Introduction
- 2 Single-Event Effects (SEE)
- 3 Device and Test Board Information
- 4 Irradiation Facility and Setup
- 5 LETEFF and Range Calculation
- 6 Test Setup and Procedures
- 7 Destructive Single-Event Effects (DSEE)
- 8 Single-Event Transients (SET)
- 9 Event Rate Calculations
- 10Summary
- 11Revision History
- A References
8 Single-Event Transients (SET)
SET are defined as heavy-ion induced transients on the VOUT, CPOUT, VREF, or PG signals of the TPS7H130x-SP. Testing was performed at room temperature (no external temperature control applied). The species used for the SET testing was 169Tm at 19.5MeV/nucleon (KSEE) and 165Ho at 15MeV/nucleon (TAMU) (for more details refer to Table 5-1). Flux of ≈105 ions/cm2/s and a fluence of ≈107 ions/cm2 per run were used for the SET characterization discussed.
Waveform size, sample rate, trigger type, value, and signal for all scopes used is presented on Table 8-1.
| Scope Model | Trigger Signal | Trigger Type | Trigger Value | Record Length | Sample Rate |
|---|---|---|---|---|---|
| PXIe-5172 (1) | VOUT | Window | ±3% | 10k | 100MS/s |
| PXIe-5172 (2) | CPOUT | Window | ±3% | 10k | 100MS/s |
| PXIe-5172 (3) | VREF | Window | ±5% | 10k | 100MS/s |
| PXIe-5172 (4) | PG | Edge Negative | 20% | 10k | 100MS/s |
The primary signals monitored during testing were VOUT and CPOUT by using a PXIe-5172 triggering using a window trigger at |3%|. VREF was also monitored using a PXIe-5172 triggering on a window trigger at |5%|. The fourth signal monitored was PG using a PXIe-5172 with a edge-negative trigger at 20% lower than the nominal value of this signal. All of these signals were monitored and triggered on their own independent NI PXIe-5172 cards.
The SET results for five production and four pre-production devices are shown in Table 8-4. As there were no upsets on PG, there is high confidence that the TPS7H130x-SP is SEFI free and the recorded transient events on the other three signals indicate that this device has a very low upper-bound cross-section against SETs, as presented in Table 8-3.
| Run # | Unit # | Device | Facility | Production Type | Ion | LETEFF (MeV·cm2/mg) | Flux (ions/cm2/s) | Fluence (ions/cm2) | VIN (V) | VOUT (V) | IOUT (mA) | # VOUT ≥ |3%| | # CPOUT ≥ |3%| | # VREF ≥ |5%| | # PG ≥ 20% |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 13 |
5 |
TPS7H1301-SP |
KSEE |
Final |
169Tm |
75 |
1.22 × 105 |
1.00 × 107 |
6 |
-5 |
150 |
0 |
7 |
0 |
0 |
| 14 |
6 |
TPS7H1301-SP | KSEE |
Final |
169Tm |
75 |
1.31 × 105 | 1.00 × 107 |
5 |
-1.8 |
400 |
3 |
81 |
3 |
0 |
| 15 | 7 | TPS7H1301-SP | KSEE |
Pre |
169Tm |
75 |
6.98 × 104 | 1.00 × 107 |
6 |
-5 |
150 |
0 |
10 |
0 |
0 |
| 16 | 8 | TPS7H1301-SP | KSEE | Pre |
169Tm |
75 |
7.31 × 104 | 1.00 × 107 |
5 |
-1.8 |
400 |
2 |
- |
0 |
0 |
| 17 | 9 | TPS7H1301-SP | TAMU | Pre | 165Ho | 75 | 7.80 × 104 | 1.00 × 107 |
5 |
-1.8 |
400 |
0 |
- |
0 |
0 |
| 18 | 10 | TPS7H1301-SP | TAMU | Pre | 165Ho | 75 | 7.72 × 104 | 1.00 × 107 |
6 |
-5 |
150 |
0 |
3 |
0 |
0 |
| 28 | 11 | TPS7H1302-SP | KSEE | Final | 169Tm | 75 | 1.22 × 105 | 1.00 × 107 | 5 | -1.8 | 400 | 0 | 99 | 0 | 0 |
| 29 | 12 | TPS7H1302-SP | KSEE | Final | 169Tm | 75 | 1.31 × 105 | 1.00 × 107 | 5 | -1.8 | 400 | 0 | 45 | 0 | 0 |
| 30 | 13 | TPS7H1302-SP | KSEE | Final | 169Tm | 75 | 6.98 × 104 | 1.00 × 107 | 5 | -1.8 | 400 | 0 | 42 | 0 | 0 |
LETEFF (MeV·cm2/mg) | Signal | VIN (V) | VOUT(V) | IOUT(A) | Fluence (ions/cm2) | # Transients | Upper-Bound Cross-Section (cm2) |
|---|---|---|---|---|---|---|---|
75 | VOUT | 5 | -1.8 | 400 | 6 × 107 | 5 | 1.94 × 10-7 |
6 | -5 | 150 | 3 × 107 | 0 | 1.23 × 10-7 | ||
CPOUT | 5 | -1.8 | 400 | 4 × 107 | 267 | 7.53 × 10-6 | |
| 6 | -5 | 150 | 3 × 107 | 20 | 1.03 × 10-6 | ||
VREF | 5 | -1.8 | 400 | 6 × 107 | 3 | 1.46 × 10-7 | |
6 | -5 | 150 | 3 × 107 | 0 | 1.23 × 10-7 | ||
PG | 5 | -1.8 | 400 | 6 × 107 | 0 | 6.15 × 10-8 | |
6 | -5 | 150 | 3 × 107 | 0 | 1.23 × 10-7 |
Figure 8-1 VOUT SET with VIN=5V, VOUT=-1.8V, IOUT=400mA
Figure 8-2 VOUT Voltage Deviation Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mA
Figure 8-3 VOUT Transient Duration Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mA
Figure 8-4 CPOUT SET with VIN=5V, VOUT=-1.8V, IOUT=400mA
Figure 8-5 CPOUT Voltage Deviation Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mA
Figure 8-6 CPOUT Transient Duration Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mA
Figure 8-7 VREF SET with VIN=5V, VOUT=-1.8V, IOUT=400mA
Figure 8-8 VREF Voltage Deviation Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mA
Figure 8-9 VREF Transient Duration Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mA
Figure 8-10 CPOUT SET with VIN=6V, VOUT=-5V, IOUT=150mA
Figure 8-11 CPOUT Voltage Deviation Histogram with VIN=6V, VOUT=-5V, IOUT=150mA
Figure 8-12 CPOUT Transient Duration Histogram with VIN=6V, VOUT=-5V, IOUT=150mA