SLVK327 July   2026 TPS7H1301-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. Introduction
  5. Single-Event Effects (SEE)
  6. Device and Test Board Information
  7. Irradiation Facility and Setup
  8. LETEFF and Range Calculation
  9. Test Setup and Procedures
  10. Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. Single-Event Transients (SET)
  12. Event Rate Calculations
  13. 10Summary
  14.   A References

Single-Event Transients (SET)

SET are defined as heavy-ion induced transients on the VOUT, CPOUT, VREF, or PG signals of the TPS7H1301-SP. Testing was performed at room temperature (no external temperature control applied). The species used for the SET testing was 169Tm at 19.5MeV/nucleon (KSEE) and 165Ho at 15MeV/nucleon (TAMU) (for more details refer to Table 5-1). Flux of ≈105 ions/cm2/s and a fluence of ≈107 ions/cm2 per run were used for the SET characterization discussed.

Waveform size, sample rate, trigger type, value, and signal for all scopes used is presented on Table 8-1.

Table 8-1 Scope Settings

Scope Model

Trigger Signal

Trigger Type

Trigger Value

Record Length

Sample Rate

PXIe-5172 (1)

VOUT

Window

±3%

10k

100MS/s

PXIe-5172 (2)

CPOUT

Window

±3%

10k

100MS/s

PXIe-5172 (3)

VREF

Window±5%

10k

100MS/s

PXIe-5172 (4)

PG

Edge Negative

20%

10k

100MS/s

The primary signals monitored during testing were VOUT and CPOUT by using a PXIe-5172 triggering using a window trigger at |3%|. VREF was also monitored using a PXIe-5172 triggering on a window trigger at |5%|. The fourth signal monitored was PG using a PXIe-5172 with a edge-negative trigger at 20% lower than the nominal value of this signal. All of these signals were monitored and triggered on their own independent NI PXIe-5172 cards.

The SET results for 2 production and 4 pre-production devices are shown in Table 8-4. As there were no upsets on PG, there is high confidence that the TPS7H1301-SP is SEFI free and the recorded transient events on the other 3 signals indicate that this device has a very low upper-bound cross-section against SETs, as presented in Table 8-3.

Table 8-2 Summary of TPS7H1301-SP SET Test Conditions and Results
Run #Unit #FacilityProduction TypeIonLETEFF (MeV·cm2/mg)Flux (ions/cm2/s)Fluence (ions/cm2)VIN (V)VOUT (V)IOUT (mA)# VOUT ≥ |3%|# CPOUT ≥ |3%|# VREF ≥ |5%|# PG ≥ 20%
13

5

KSEE

Final

169Tm

75

1.22 × 105

1.00 × 107

6

-5

150

0

7

0

0

14

6

KSEE

Final

169Tm

75

1.31 × 1051.00 × 107

5

-1.8

400

3

81

3

0

157KSEE

Pre

169Tm

75

6.98 × 1041.00 × 107

6

-5

150

0

10

0

0

168KSEEPre

169Tm

75

7.31 × 1041.00 × 107

5

-1.8

400

2

-

0

0

179TAMUPre165Ho757.80 × 1041.00 × 107

5

-1.8

400

0

-

0

0

1810TAMUPre165Ho757.72 × 1041.00 × 107

6

-5

150

0

3

0

0

Table 8-3 TPS7H1301-SP SET Cross-Sections

LETEFF (MeV·cm2/mg)

Signal

VIN

(V)

VOUT(V)IOUT(A)

Fluence (ions/cm2)

# Transients

Upper-Bound Cross-Section (cm2)

75

VOUT

5

-1.8

400

3 × 107

5

3.89 × 10-7

6

-5

150

3 × 107

0

1.23 × 10-7

CPOUT

5

-1.8400

1 × 107

81

1.01 × 10-5

6-5150

3 × 107

20

1.03 × 10-6

VREF

5

-1.8400

3 × 107

3

2.92 × 10-7

6

-5150

3 × 107

0

1.23 × 10-7

PG

5

-1.8400

3 × 107

0

1.23 × 10-7

6

-5150

3 × 107

0

1.23 × 10-7

 VOUT SET with VIN=5V, VOUT=-1.8V, IOUT=400mAFigure 8-1 VOUT SET with VIN=5V, VOUT=-1.8V, IOUT=400mA
 VOUT Voltage Deviation
                        Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mAFigure 8-2 VOUT Voltage Deviation Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mA
 VOUT Transient Duration
                        Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mAFigure 8-3 VOUT Transient Duration Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mA
 CPOUT SET with VIN=5V, VOUT=-1.8V, IOUT=400mAFigure 8-4 CPOUT SET with VIN=5V, VOUT=-1.8V, IOUT=400mA
 CPOUT Voltage Deviation
                        Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mAFigure 8-5 CPOUT Voltage Deviation Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mA
 CPOUT Transient Duration
                        Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mAFigure 8-6 CPOUT Transient Duration Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mA
 VREF SET with VIN=5V, VOUT=-1.8V, IOUT=400mAFigure 8-7 VREF SET with VIN=5V, VOUT=-1.8V, IOUT=400mA
 VREF Voltage Deviation
                        Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mAFigure 8-8 VREF Voltage Deviation Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mA
 VREF Transient Duration
                        Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mAFigure 8-9 VREF Transient Duration Histogram with VIN=5V, VOUT=-1.8V, IOUT=400mA
 CPOUT SET with VIN=6V, VOUT=-5V, IOUT=150mAFigure 8-10 CPOUT SET with VIN=6V, VOUT=-5V, IOUT=150mA
 CPOUT Voltage Deviation
                        Histogram with VIN=6V, VOUT=-5V, IOUT=150mAFigure 8-11 CPOUT Voltage Deviation Histogram with VIN=6V, VOUT=-5V, IOUT=150mA
 CPOUT Transient Duration
                        Histogram with VIN=6V, VOUT=-5V, IOUT=150mAFigure 8-12 CPOUT Transient Duration Histogram with VIN=6V, VOUT=-5V, IOUT=150mA