SLVK327 July   2026 TPS7H1301-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 LETEFF and Range Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References

1 Introduction

The TPS7H1301-SP is a radiation-hardened, charge pump voltage inverter with an integrated low dropout adjustable regulator. The device features an input voltage range of 3V to 6.3V, capable of providing an output current of 400mA with an adjustable output voltage range of -0.6V to -6V. The TPS7H1301-SP integrates several key functions such as:

  • External compensation by incorporating direct error amp access via the STAB pin
  • Internal switching frequency of 500kHz
  • Typical quiescent current of 15mA and typical charge-pump resistance of 3.5Ω makes the TPS7H1301-SP ideal for:
    • Driving power amplifiers
    • DAC bias rails
    • Low noise negative voltage applications

The device is offered in a 14-pin CFP ceramic package. General device information and test conditions are listed in the overview information table. For more detailed technical specifications, user-guides, and application notes please go to device product page.

Table 1-1 Overview Information
DESCRIPTION(1)DEVICE INFORMATION
TI Part NumberTPS7H1301-SP
Orderable Part Number5962R2421501VXC
Device FunctionCharge Pump Voltage Inverter
TechnologyLBC7 (Linear BiCMOS 7)
Exposure FacilityFacility for Rare Istotope Beams, K500 Cyclotron (KSEE), Michigan State University (19.5MeV/nucleon) and Radiation Effects Facility, Cyclotron Institute, Texas A&M University (15MeV/nucleon)
Heavy Ion Fluence per Run1.00 × 107ions/cm2
Irradiation Temperature25°C (for SEB/SEGR testing), 25°C (for SET testing), and 125°C (for SEL testing)
(1) TI may provide technical, applications or design advice, quality characterization, and reliability data or service, providing these items shall not expand or otherwise affect TI's warranties as set forth in the Texas Instruments Incorporated Standard Terms and Conditions of Sale for Semiconductor Products and no obligation or liability shall arise from Semiconductor Products and no obligation or liability shall arise from TI's provision of such items.