8 Single-Event Transients (SET)

SET are defined as heavy-ion-induced transients upsets on each channel's VOUT of the TPS7H4102-SEP.

Testing was performed at room temperature (no external temperature control applied). The heavy-ions species used for the SET testing were Silver (¹⁰⁹Ag) for an LET_EFF = 48 MeV·cm²/mg, for more details refer to Table 5-1. Flux of ≈10⁵ ions/cm²/s and a fluence of ≈10⁷ ions/cm² per run were used for the SETs characterization discussed on this chapter.

SET testing was conducted in two bias conditions, V_IN = 5V with V_OUT = 1.8V and V_IN = 3.3V with V_OUT = 1.2V. One unit was characterized at each bias condition, waveform size, sample rate, trigger type, value, and signal for all scopes used is presented on Table 8-1. Table 8-9 summarizes the results for the two units tested. As the summary of results shows, there were no observed transients on any of the output channels during the SET testing, indicating the TPS7H4102-SEP is SET and SEFI free at 48 MeV·cm²/mg.

Note: Only one Signal was used as a trigger source at a time, this table presents all possible sources for a given scope, the same is valid for the trigger type. All percentage specified on the trigger value are deviation from the nominal value.