SLVK230 November   2025 TPS7H4102-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 LETEFF and Range Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Safe Operating Area (SOA) Results
    2. 7.2 Single-Event Latch-up (SEL) Results
    3. 7.3 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References

1 Introduction

The TPS7H4104 and TPS7H4102 are 7V, 3A per channel, multichannel, peak-current mode, synchronous buck converters optimized for use in area sensitive, space environment applications. The device incorporates four (TPS7H4104) or two (TPS7H4102) identical channels that can be use to step down the power input voltage into independent voltages up to 3A per phase or interleaved to increment the output current up to 12A (TPS7H4104) or 6A (TPS7H4102).

Each channel incorporates:

  • High and low side power MOSFETs with programmable soft-start and slope compensation
  • Power-good flags and enable signaling

The device also offers:

  • An EN_SEQ input to create a sequential power up and reverse sequence power down
  • Current limit mechanisms for robust current limiting during fault conditions
  • Thermal shutdown to disable the device if the die temperature exceeds the thermal limit

The device is offered in a 64-pin plastic package. General device information and test conditions are listed in the overview information table. For more detailed technical specifications, user-guides, and application notes please go to device product page.

Table 1-1 Overview Information
DESCRIPTION(1) DEVICE INFORMATION
TI Part Number TPS7H4102-SEP
Orderable Part Number TPS7H4102MPAPTSEP
Device Function Multichannel Synchronous Buck Converter
Technology LBC7 (Linear BiCMOS 7)
Exposure Facility Radiation Effects Facility, Cyclotron Institute, Texas A&M University (15 MeV/nucleon)

and Facility for Rare Isotope Beams, K500 Cyclotron (KSEE), Michigan State University (19.5 MeV/nucleon)
Heavy Ion Fluence per Run 1.00 × 107 ions/cm2
Irradiation Temperature 25°C (for SEB/SEGR testing and SET testing), and 125°C (for SEL testing)
(1) TI may provide technical, applications or design advice, quality characterization, and reliability data or service, providing these items shall not expand or otherwise affect TI's warranties as set forth in the Texas Instruments Incorporated Standard Terms and Conditions of Sale for Semiconductor Products and no obligation or liability shall arise from Semiconductor Products and no obligation or liability shall arise from TI's provision of such items.