SLVK230 November   2025 TPS7H4102-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 LETEFF and Range Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Safe Operating Area (SOA) Results
    2. 7.2 Single-Event Latch-up (SEL) Results
    3. 7.3 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References

5 LETEFF and Range Calculation

Generalized Cross-Section of the LBC7 Technology BEOL Stack on the TPS7H4102-SEP [Left] and SEUSS 2024 Application Used to Determine Key Ion Parameters [Right]Figure 5-1 Generalized Cross-Section of the LBC7 Technology BEOL Stack on the TPS7H4102-SEP [Left] and SEUSS 2024 Application Used to Determine Key Ion Parameters [Right]

The TPS7H4102-SEP is fabricated in the TI Linear BiCMOS 250-nm process with a back-end-of-line (BEOL) stack consisting of 4 levels of standard thickness aluminum. The total stack height from the surface of the passivation to the silicon surface is 10.04μm based on nominal layer thickness as shown in Figure 5-1. Accounting for energy loss through the degrader, copper foil, beam port window, air gap, and the BEOL stack of the TPS7H4102-SEP, the effective LET (LETEFF) at the surface of the silicon substrate and the range was determined with:

  • SEUSS 2024 software (provided by TAMU and based on the latest SRIM-2013 [7] models).
  • MSU Stack-Up Calculator (provided by MSU FRIB and based on latest SRIM-2013 [7] models).

The results are shown in Table 5-1.

Table 5-1 Ion LETEFF and Range in Silicon
FacilityION TYPEBeam Energy (MeV/nucleon)ANGLE OF INCIDENCEDEGRADER STEPS (#)DEGRADER ANGLECopper Foil Width (µm)Beam Port WindowRANGE IN SILICON (µm)LETEFF (MeV·cm2/mg)
TAMU109Ag15000-1-mil Aramica95.148
TAMU165Ho15000-1-mil Aramica93.975
KSEE109Ag19.500053-mil PEN89.348
KSEE169Tm19.500053-mil PEN9075