ZHCSIE4A June   2018  – July 2018 TMS320F28035-EP

PRODUCTION DATA.  

  1. 1器件概述
    1. 1.1 特性
    2. 1.2 应用范围
    3. 1.3 说明
    4. 1.4 功能方框图
  2. 2修订历史记录
  3. 3Terminal Configuration and Functions
    1. 3.1 Pin Diagram
    2. 3.2 Signal Descriptions
      1. Table 3-1 Signal Descriptions
  4. 4Specifications
    1. 4.1  Absolute Maximum Ratings
    2. 4.2  ESD Ratings
    3. 4.3  Power-On Hours (POH) Limits
    4. 4.4  Recommended Operating Conditions
    5. 4.5  Power Consumption Summary
      1. Table 4-1 TMS320F2803x Current Consumption at 60-MHz SYSCLKOUT
      2. 4.5.1     Reducing Current Consumption
      3. 4.5.2     Current Consumption Graphs (VREG Enabled)
    6. 4.6  Electrical Characteristics
    7. 4.7  Thermal Resistance Characteristics
    8. 4.8  Thermal Design Considerations
    9. 4.9  Emulator Connection Without Signal Buffering for the MCU
    10. 4.10 Parameter Information
      1. 4.10.1 Timing Parameter Symbology
      2. 4.10.2 General Notes on Timing Parameters
    11. 4.11 Test Load Circuit
    12. 4.12 Power Sequencing
      1. Table 4-4 Reset (XRS) Timing Requirements
      2. Table 4-5 Reset (XRS) Switching Characteristics
    13. 4.13 Clock Specifications
      1. 4.13.1 Device Clock Table
        1. Table 4-6 2803x Clock Table and Nomenclature (60-MHz Devices)
        2. Table 4-7 Device Clocking Requirements/Characteristics
        3. Table 4-8 Internal Zero-Pin Oscillator (INTOSC1/INTOSC2) Characteristics
      2. 4.13.2 Clock Requirements and Characteristics
        1. Table 4-9  XCLKIN Timing Requirements – PLL Enabled
        2. Table 4-10 XCLKIN Timing Requirements – PLL Disabled
        3. Table 4-11 XCLKOUT Switching Characteristics (PLL Bypassed or Enabled)
    14. 4.14 Flash Timing
      1. Table 4-12 Flash/OTP Endurance
      2. Table 4-13 Flash Parameters at 60-MHz SYSCLKOUT
      3. Table 4-14 Flash/OTP Access Timing
      4. Table 4-15 Flash Data Retention Duration
  5. 5Detailed Description
    1. 5.1 Overview
      1. 5.1.1  CPU
      2. 5.1.2  Control Law Accelerator (CLA)
      3. 5.1.3  Memory Bus (Harvard Bus Architecture)
      4. 5.1.4  Peripheral Bus
      5. 5.1.5  Real-Time JTAG and Analysis
      6. 5.1.6  Flash
      7. 5.1.7  M0, M1 SARAMs
      8. 5.1.8  L0 SARAM, and L1, L2, and L3 DPSARAMs
      9. 5.1.9  Boot ROM
        1. 5.1.9.1 Emulation Boot
        2. 5.1.9.2 GetMode
        3. 5.1.9.3 Peripheral Pins Used by the Bootloader
      10. 5.1.10 Security
      11. 5.1.11 Peripheral Interrupt Expansion (PIE) Block
      12. 5.1.12 External Interrupts (XINT1–XINT3)
      13. 5.1.13 Internal Zero Pin Oscillators, Oscillator, and PLL
      14. 5.1.14 Watchdog
      15. 5.1.15 Peripheral Clocking
      16. 5.1.16 Low-power Modes
      17. 5.1.17 Peripheral Frames 0, 1, 2, 3 (PFn)
      18. 5.1.18 General-Purpose Input/Output (GPIO) Multiplexer
      19. 5.1.19 32-Bit CPU-Timers (0, 1, 2)
      20. 5.1.20 Control Peripherals
      21. 5.1.21 Serial Port Peripherals
    2. 5.2 Memory Maps
    3. 5.3 Register Maps
    4. 5.4 Device Emulation Registers
    5. 5.5 VREG/BOR/POR
      1. 5.5.1 On-chip Voltage Regulator (VREG)
        1. 5.5.1.1 Using the On-chip VREG
        2. 5.5.1.2 Disabling the On-chip VREG
      2. 5.5.2 On-chip Power-On Reset (POR) and Brown-Out Reset (BOR) Circuit
    6. 5.6 System Control
      1. 5.6.1 Internal Zero Pin Oscillators
      2. 5.6.2 Crystal Oscillator Option
      3. 5.6.3 PLL-Based Clock Module
      4. 5.6.4 Loss of Input Clock (NMI Watchdog Function)
      5. 5.6.5 CPU-Watchdog Module
    7. 5.7 Low-Power Modes Block
    8. 5.8 Interrupts
      1. 5.8.1 External Interrupts
        1. 5.8.1.1 External Interrupt Electrical Data/Timing
          1. Table 5-20 External Interrupt Timing Requirements
          2. Table 5-21 External Interrupt Switching Characteristics
    9. 5.9 Peripherals
      1. 5.9.1  Control Law Accelerator (CLA) Overview
      2. 5.9.2  Analog Block
        1. 5.9.2.1 Analog-to-Digital Converter (ADC)
          1. 5.9.2.1.1 Features
          2. 5.9.2.1.2 ADC Start-of-Conversion Electrical Data/Timing
            1. Table 5-26 External ADC Start-of-Conversion Switching Characteristics
          3. 5.9.2.1.3 On-Chip Analog-to-Digital Converter (ADC) Electrical Data/Timing
            1. Table 5-27  ADC Electrical Characteristics
            2. Table 5-28  ADC Power Modes
            3. 5.9.2.1.3.1 Internal Temperature Sensor
              1. Table 5-29 Temperature Sensor Coefficient
            4. 5.9.2.1.3.2 ADC Power-Up Control Bit Timing
              1. Table 5-30 ADC Power-Up Delays
            5. 5.9.2.1.3.3 ADC Sequential and Simultaneous Timings
        2. 5.9.2.2 ADC MUX
        3. 5.9.2.3 Comparator Block
          1. 5.9.2.3.1 On-Chip Comparator/DAC Electrical Data/Timing
            1. Table 5-32 Electrical Characteristics of the Comparator/DAC
      3. 5.9.3  Detailed Descriptions
      4. 5.9.4  Serial Peripheral Interface (SPI) Module
        1. 5.9.4.1 SPI Master Mode Electrical Data/Timing
          1. Table 5-35 SPI Master Mode External Timing (Clock Phase = 0)
          2. Table 5-36 SPI Master Mode External Timing (Clock Phase = 1)
        2. 5.9.4.2 SPI Slave Mode Electrical Data/Timing
          1. Table 5-37 SPI Slave Mode External Timing (Clock Phase = 0)
          2. Table 5-38 SPI Slave Mode External Timing (Clock Phase = 1)
      5. 5.9.5  Serial Communications Interface (SCI) Module
      6. 5.9.6  Local Interconnect Network (LIN)
      7. 5.9.7  Enhanced Controller Area Network (eCAN) Module
      8. 5.9.8  Inter-Integrated Circuit (I2C)
        1. 5.9.8.1 I2C Electrical Data/Timing
          1. Table 5-44 I2C Timing Requirements
          2. Table 5-45 I2C Switching Characteristics
      9. 5.9.9  Enhanced PWM Modules (ePWM1/2/3/4/5/6/7)
        1. 5.9.9.1 ePWM Electrical Data/Timing
          1. Table 5-48 ePWM Timing Requirements
          2. Table 5-49 ePWM Switching Characteristics
        2. 5.9.9.2 Trip-Zone Input Timing
          1. Table 5-50 Trip-Zone Input Timing Requirements
      10. 5.9.10 High-Resolution PWM (HRPWM)
        1. 5.9.10.1 HRPWM Electrical Data/Timing
          1. Table 5-51 High-Resolution PWM Characteristics
      11. 5.9.11 Enhanced Capture Module (eCAP1)
        1. 5.9.11.1 eCAP Electrical Data/Timing
          1. Table 5-53 Enhanced Capture (eCAP) Timing Requirement
          2. Table 5-54 eCAP Switching Characteristics
      12. 5.9.12 High-Resolution Capture (HRCAP) Module
        1. 5.9.12.1 HRCAP Electrical Data/Timing
          1. Table 5-56 High-Resolution Capture (HRCAP) Timing Requirements
      13. 5.9.13 Enhanced Quadrature Encoder Pulse (eQEP)
        1. 5.9.13.1 eQEP Electrical Data/Timing
          1. Table 5-58 Enhanced Quadrature Encoder Pulse (eQEP) Timing Requirements
          2. Table 5-59 eQEP Switching Characteristics
      14. 5.9.14 JTAG Port
      15. 5.9.15 General-Purpose Input/Output (GPIO) MUX
        1. 5.9.15.1 GPIO Electrical Data/Timing
          1. 5.9.15.1.1 GPIO - Output Timing
            1. Table 5-63 General-Purpose Output Switching Characteristics
          2. 5.9.15.1.2 GPIO - Input Timing
            1. Table 5-64 General-Purpose Input Timing Requirements
          3. 5.9.15.1.3 Sampling Window Width for Input Signals
          4. 5.9.15.1.4 Low-Power Mode Wakeup Timing
            1. Table 5-65 IDLE Mode Timing Requirements
            2. Table 5-66 IDLE Mode Switching Characteristics
            3. Table 5-67 STANDBY Mode Timing Requirements
            4. Table 5-68 STANDBY Mode Switching Characteristics
            5. Table 5-69 HALT Mode Timing Requirements
            6. Table 5-70 HALT Mode Switching Characteristics
  6. 6Applications, Implementation, and Layout
    1. 6.1 TI Design or Reference Design
  7. 7器件和文档支持
    1. 7.1 使用入门
    2. 7.2 器件和开发支持工具命名规则
    3. 7.3 工具和软件
    4. 7.4 文档支持
    5. 7.5 Community Resources
    6. 7.6 商标
    7. 7.7 静电放电警告
    8. 7.8 术语表
  8. 8机械、封装和可订购信息
    1. 8.1 封装信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

1.1 特性

  • 高效 32 位 CPU (TMS320C28x)
    • 60MHz（16.67ns 周期时间）
    • 16 × 16 和 32 × 32 MAC 操作
    • 16 × 16 双 MAC
    • 哈佛 (Harvard) 总线架构
    • 连动运算
    • 快速中断响应和处理
    • 统一存储器编程模型
    • 高效代码（使用 C/C++ 和汇编语言）
  • 可编程控制律加速器 (CLA)
    • 32 位浮点算术加速器
    • 独立于主 CPU 之外的代码执行
  • 尾数法：小尾数法
  • 支持 JTAG 边界扫描
    • IEEE 标准 1149.1-1990 标准测试访问端口和边界扫面架构
  • 器件和系统均可实现低成本：
    • 3.3V 单电源
    • 无需电源排序
    • 集成型加电复位和欠压复位
    • 低功率
    • 无模拟支持引脚
  • 计时:
    • 两个内部零引脚振荡器
    • 片载晶体振荡器及外部时钟输入
    • 看门狗定时器模块
    • 丢失时钟检测电路
  • 多达 45 个具有输入滤波功能可单独编程的多路复用通用输入输出 (GPIO) 引脚
  • 可支持所有外设中断的外设中断扩展 (PIE) 模块
  • 三个 32 位 CPU 定时器
  • 每个增强型脉宽调制器 (ePWM) 中均有一个独立的 16 位计时器
  • 片载存储器
    • 闪存，SRAM，OTP，引导 ROM 可用
  • 代码安全模块
  • 128 位安全密钥和锁
    • 保护安全内存块
    • 防止固件逆向工程
  • 串行端口外设
    • 一个串行通信接口 (SCI) 通用异步接收器/发送器 (UART) 模块
    • 两个串行外设接口 (SPI) 模块
    • 一个内部集成电路 (I2C) 模块
    • 一个本地互联网络 (LIN) 模块
    • 一个增强型控制器局域网 (eCAN) 模块
  • 增强型控制外设
    • ePWM
    • 高分辨率 PWM (HRPWM)
    • 增强型捕捉 (eCAP)模块
    • 高分辨率输入捕捉 (HRCAP) 模块
    • 增强型正交编码器脉冲 (eQEP) 模块
    • 模数转换器 (ADC)
    • 片载温度传感器
    • 比较器
  • 高级仿真 特性
    • 分析和断点功能
    • 通过硬件进行实时调试
  • 80 引脚 PN 薄型四方扁平 (LQFP) 封装
  • 支持国防、航天和医疗 应用：
    • 受控基线
    • 一个组装/测试场所
    • 一个制造场所
    • 在扩展温度范围（-55°C 至 125°C）内可用
    • 延长的产品生命周期
    • 延长的产品变更通知
    • 产品可追溯性