ZHCSVF5E July 1985 – March 2024 SN75ALS192
PRODUCTION DATA
- 1
- 1 特性
- 2 应用
- 3 说明
- 4 Pin Configuration and Functions
-
5 Specifications
- 5.1 Absolute Maximum Ratings
- 5.2 Dissipation Rating Table
- 5.3 Recommended Operating Conditions
- 5.4 Thermal Information
- 5.5 Electrical Characteristics
- 5.6 Switching Characteristics
- 5.7 Typical Characteristics Operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied.
- 6 Parameter Measurement Information
- 7 Device Functional Modes
- 8 Device and Documentation Support
- 9 Revision History
- 10Mechanical, Packaging, and Orderable Information
封装选项
请参考 PDF 数据表获取器件具体的封装图。
机械数据 (封装 | 引脚)
- NS|16
- N|16
- D|16
散热焊盘机械数据 (封装 | 引脚)
订购信息
5.7 Typical Characteristics(3)
Figure 5-1 Y Output Voltage vs Data Input Voltage
The A input is connected to VCC during the testing of the Y outputs and to ground during the testing of the Z outputs.
Figure 5-3 Y Output Voltage vs Enable G Input Voltage
The A input is connected to VCC during the testing of the Y outputs and to ground during the testing of the Z outputs.
Figure 5-5 Z Output Voltage vs Enable G Input Voltage
The A input is connected to VCC during the testing of the Y outputs and to ground during the testing of the Z outputs.
Figure 5-7 High-level Output Voltage vs Free-air Temperature
The A input is connected to GND during the testing of the Y outputs and to VCC during the testing of the Z outputs.
Figure 5-9 Low-level Output Voltage vs Free-air Temperature
Figure 5-11 Supply Current vs Supply Voltage
Figure 5-13 Supply Current vs Frequency
Figure 5-2 Y Output Voltage vs Data Input Voltage
The A input is connected to VCC during the testing of the Y outputs and to ground during the testing of the Z outputs.
Figure 5-4 Y Output Voltage vs Enable G Input Voltage
The A input is connected to GND during the testing of the Y outputs and to VCC during the testing of the Z outputs.
Figure 5-6 Z Output Voltage vs Enable G Input Voltage
The A input is connected to VCC during the testing of the Y outputs and to ground during the testing of the Z outputs.
Figure 5-8 High-level Output Voltage vs Output Current
The A input is connected to GND during the testing of the Y outputs and to VCC during the testing of the Z outputs.
Figure 5-10 Low-level Output Voltage vs Low-level Output Current
Figure 5-12 Supply Current vs Supply Voltage†. Operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied.