SPRZ452I july   2018  – may 2023 AM6526 , AM6528 , AM6546 , AM6548

 

  1. 1Usage Notes and Advisories Matrices
  2. 2Nomenclature, Package Symbolization, and Revision Identification
    1. 2.1 Device and Development-Support Tool Nomenclature
    2. 2.2 Devices Supported
    3. 2.3 Package Symbolization and Revision Identification
  3. 3Silicon Revision 2.1, 2.0, 1.0 Usage Notes and Advisories
    1. 3.1 Silicon Revision 2.1, 2.0, 1.0 Usage Notes
      1. 3.1.1 Fail-Safe IO's: Latch-up Risk on Fail-Safe IOs
      2. 3.1.2 ADC: High Input Leakage Current May Impact ADC Accuracy
      3. 3.1.3 INTRTR: Spurious Interrupts Generated when Programming Certain Interrupt Routers
      4.      i2351
    2. 3.2 Silicon Revision 2.1, 2.0, 1.0 Advisories
      1. 3.2.1 Silicon Revision 2.1, 2.0, 1.0 Advisory List
      2.      i939
      3.      i2000
      4.      i2004
      5.      i2006
      6.      i2009
      7.      i2013
      8.      i2015
      9.      i2018
      10.      i2019
      11.      i2020
      12.      i2021
      13.      i2022
      14.      i2023
      15.      i2024
      16.      i2025
      17.      i2026
      18.      i2027
      19.      i2028
      20.      i2030
      21.      i2032
      22.      i2037
      23.      i2038
      24.      i2039
      25.      i2046
      26.      i2053
      27.      i2054
      28.      i2055
      29.      i2068
      30.      i2069
      31.      i2073
      32.      i2075
      33.      i2076
      34.      i2083
      35.      i2084
      36.      i2095
      37.      i2096
      38.      i2097
      39.      i2098
      40.      i2099
      41.      i2101
      42.      i2103
      43.      i2104
      44.      i2106
      45.      i2115
      46.      i2116
      47.      i2118
      48.      i2119
      49.      i2129
      50.      i2132
      51.      i2137
      52.      i2138
      53.      i2139
      54.      i2141
      55.      i2143
      56.      i2146
      57.      i2148
      58.      i2149
      59.      i2161
      60.      i2162
      61.      i2164
      62.      i2165
      63.      i2177
      64.      i2184
      65.      i2185
      66.      i2187
      67.      i2189
      68.      i2193
      69.      i2196
      70.      i2198
      71.      i2204
      72.      i2207
      73.      i2231
      74.      i2234
      75.      i2245
      76.      i2307
      77.      i2014
      78.      i2145
      79.      i2163
      80.      i2173
      81.      i2249
      82.      i2278
      83.      i2279
      84.      i2307
      85.      i2310
      86.      i2311
      87.      i2320
      88.      i2328
      89.      i2329
      90.      i2040
      91.      i2041
      92.      i2043
      93. 3.2.2 i2151
      94.      i2262
      95.      i2264
      96.      i2265
      97.      i2266
      98.      i2268
      99.      i2312
      100.      i2371
        1.       Trademarks
          1.        Revision History

i2026


MMCSD: Negative Current from UHS-I PHY May Create an Over-Voltage Condition on VDDS6 and VDDS7 Which Exposes the Device to a Significant Reliability Risk

Revision(s) Affected:

AM65x SR 1.0

Details:

The MMCSD0 UHS-I PHY and MMCSD1 UHS-I PHY receives 1.8 V bias power from device pins VDDS6 and VDDV7 respectively. Unexpected paths through the UHS-I PHY allows current to flow from VDDSHV6 to VDDS6 and VDDSHV7 to VDDS7 when the VDDSHV IO supply is operating at 3.3 V.

The UHS-I PHY typically consumes power from its VDDS bias supply. However, the unexpected current flowing from the 3.3 V VDDSHV IO supply may exceed the bias current consumed by the UHS-I PHY. When this occurs, current may flow out of the 1.8 V VDDS bias supply. This negative current may cause the voltage applied to VDDS6 and VDDS7 to increase above the recommended operating range in some operating conditions.

This issue has been observed on a system where SDIO LDO was sourcing the UHS-I PHY bias supply while its VDDSHV IO supply was 3.3 V. This occurs because SDIO LDO was not designed to sink current. Therefore, it is not able to shunt any negative current to VSS. Negative current causes the VDDS bias supply to increase above the recommended bias supply voltage where the UHS-I PHY enters a non-functional state that can only be cleared when the respective MMCSD subsystem is reset.

The negative current is a function of device operating temperature, device process variation, and UHS-I PHY output toggle rate.

This issue can also occur when the IOs associated with MMCSD0 UHS-I PHY and MMCSD1 UHS-I PHY are operating at 3.3 V while configured to one of the other MUXMODES defined in the Datasheet Pin Multiplexing Table (when IOMUX_ENABLE bit in the respective MMCSD0_SS_PHY_CTRL_1_REG or MMCSD1_SS_PHY_CTRL_1_REG register is set to 1 to enable alternate MUXMODES).

Further analysis has indicated a significant reliability risk when operating VDDSHV6 and VDDSHV7 at 3.3 V.

This issue does not occur when the VDDSHV IO supply is operating at 1.8 V.

Workaround(s):

There is no workaround which prevents the negative current from producing an overvoltage condition. Therefore, there is no support for operating VDDSHV6 and VDDSHV7 at 3.3 V.