SLVK304 April   2026 TMUX182-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single-Event Latch-up (SEL) Results
    2. 5.2 Single-Event Transients (SET) Results
  9. 6Summary
  10. 7References

1 Overview

The TMUX182-SEP is a radiation-tolerant, general purpose complementary metal-oxide semiconductor (CMOS) multiplexer (MUX). The device works with a single supply (5V to 15V), dual supplies (up to ±6V), or asymmetric supplies (such as VDD = 6V, VSS = –3V). The wide supply voltage range allows the devices to be used in a broad array of applications in space.

The TMUX182-SEP supports bidirectional analog signals on the source (Sx) and drain (Dx) pins ranging from VSS to VDD. All logic inputs have 1.8V logic-compatible thresholds, which is compatible for both TTL and CMOS logic when operating with a valid supply voltage.

For more information, see the TMUX182-SEP product page.

Table 1-1 Overview Information
DescriptionDevice Information
TI Part NumberTMUX182-SEP
Orderable Part NumberTMUX182MDYYTSEP
VID NumberV62/26609-01XE
Device FunctionRadiation Tolerant 15V, 8:1, 1-Channel Multiplexer with 1.8V Logic
TechnologyLBC9
Exposure Facility (SEL)Facility for Rare Isotope Beams (FRIB), K500 Cyclotron (KSEE), Michigan State University
Heavy Ion Fluence per Run1 × 107 ions/cm2
Irradiation Temperature25°C (for SET testing) and 125°C (for SEL testing)