SETs are defined as heavy-ion-induced transient upsets on output pins D of the TMUX182-SEP. SET testing was performed at room temperature (no external temperature control applied). The species used for the SET testing was ¹⁰⁹Ag for a LET_EFF = 47MeV × cm²/mg. Flux of approximately 1 × 10⁵ ions/cm² × s and a fluence of approximately 1 × 10⁷ ions/cm² were used for the SET runs.

One unit was tested across multiple input conditions to determine the worst-case setup for SETs. For Bias 1, one unit was powered up and exposed to the heavy-ions using supply voltage of 5V using a National Instruments PXI Chassis PXIe-4137. The bias was configured to select signal S7 as an output. A 0V to 1.8V, 1MHz square wave on input S7 was generated using a National Instruments PXI Chassis PXIe-5433 function generator. For Bias 2, one unit was powered up and exposed to the heavy-ions using supply voltage of ±5V using a National Instruments PXI Chassis PXIe-4137 and PXI Chassis PXIe-4139. The bias was configured to select signal S7 as an output. Pin S7 was connected to VDD. The run duration to achieve target fluence was approximately 100 seconds. Bias 1 showed transient upsets while Bias 2 showed no transient upsets, as listed in Table 5-3.

To capture SETs, one NI PXI-5110 scope card was used to continuously monitor the output voltage on pin D. The scope monitoring the square wave output signal was configured to a width pulse trigger of ±5%, while the scope monitoring the static output signal was configured to a voltage trigger of ±5%. The NI scopes were programmed to a sample rate of 100M samples per second (S/s) and recorded 1000 samples, with a 5% pretrigger reference, in case of an event (trigger). The setup was verified for each run to ensure no false triggers was captured before the beam was turned on. The ±5% threshold on the static and square wave outputs was determined to be the lowest threshold capable of not providing false triggers due to noise.

Under heavy-ions, the TMUX182-SEP exhibited transients on output D. The number of transients on each run are listed in Table 5-3.

Worst case transient are shown below. A few different types of transients are observed:

1. Signal Transient:
   1. Runt Trigger: Output shows signal distortion with periodic distorted pulses. Example shown in Figure 5-3. This example shows the maximum observed duration glitch with a duration of 4µs.
   2. Delayed Rising Edge: Output shows an extended low interval followed by a shortened high pulse causing a delayed rising edge. Example shown in Figure 5-4. This example shows the maximum duration observed was 1µs.

Figure 5-3 Single Event Transient on Dynamic Signal - Runt Trigger

Figure 5-4 Single Event Transient on Dynamic Signal - Delayed Rising Edge

Using the MFTF method shown in Single-Event Effects (SEE) Confidence Internal Calculations, the upper-bound cross section (using a 95% confidence level) for Bias 1 dynamic outputs (D) is calculated as:

Using the MFTF method shown in Single-Event Effects (SEE) Confidence Internal Calculations, the upper-bound cross section (using a 95% confidence level) for Bias 2 static outputs (D) is calculated as: