SLVK304 April   2026 TMUX182-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single-Event Latch-up (SEL) Results
    2. 5.2 Single-Event Transients (SET) Results
  9. 6Summary
  10. 7References

Abstract

The purpose of this study is to characterize the single-event effects (SEE) performance due to heavy-ion irradiation of the TMUX182-SEP. SEE performance was verified at minimum (5V) and maximum (±6V) for dual-rail operating condition and maximum (15V) for single-rail operating condition. Heavy-ions with an LETEFF of 47MeV-cm2/mg were used to irradiate five production devices with a fluence of 1 × 107 ions/cm2. The results demonstrate that the TMUX182-SEP is SEL-free up to LETEFF = 47MeV-cm2/mg as 125°C. SET performance at minimum and maximum operating voltages saw excursions ≥|5%| trigger up to fluence 1 × 107 ions/cm2, as shown and discussed in this report.