3 Test Device and Test Board Information

The TMUX182-SEP is a packaged 16-pin DYY, SOT-23-THN plastic package shown in the pinout diagram in Figure 3-1. Figure 3-2 shows the device with the package cap decapped to reveal the die for heavy-ion testing. Figure 3-3 shows the evaluation board used for single-event effects. Figure 3-4 and Figure 3-5 show the bias diagrams used for SEL testing. Figure 3-6 and Figure 3-7 show the bias diagrams used for single-event transient (SET) testing.

Figure 3-1 TMUX182-SEP Pinout Diagram

Figure 3-2 Photo of TMUX182-SEP Package Decapped

Figure 3-3 TMUX182-SEP Evaluation Board (Top View) for SEL Testing

Figure 3-4 TMUX182-SEP SEL Bias 1 Diagram

Figure 3-6 TMUX182-SEP SET Bias 1 Diagram

Figure 3-5 TMUX182-SEP SEL Bias 2 Diagram

Figure 3-7 TMUX182-SEP SET Bias 2 Diagram